Several experimental techniques are available to investigate materials but microscopic techniques based on hyperfine interaction form a subclass that can characterize materials at the smallest possible atomic scale. The interaction of the nuclear electromagnetic moments with the hyperfine fields arising from the extranuclear electronic charges and spin distributions forms the basis of hyperfine methods. In this review article, one of the hyperfine methods, known as perturbed angular correlation (PAC), has been described as it provides local-scale fingerprints about the formation, identification, and lattice environment of defects and/or defect complexes in semiconductors at the PAC probe site. In particular, the potential of the PAC technique has been demonstrated in terms of measured electric field gradient, its orientation, and the symmetry at the probe site for a variety of defects in semiconductors such as Si, InP, GaAs, InAs, ZnO, GaP, and InN.
Article PDF
Similar content being viewed by others
Avoid common mistakes on your manuscript.
References
G. Schatz and A. Weidinger, Nuclear Condensed Matter Physics: Nuclear Methods and Applications (Wiley, New York, 1996 2nd ed)
H. Frauenfelder and R.M. Steffen, Alpha, Beta and Gamma Ray Spectroscopy, ed. K. Siegbahn (Amsterdam: North Holland, 1965), p. 997
T. Wichert and E. Recknagel, Microscopic Methods in Metals, ed. U. Gonser (Berlin: Springer, 1986), p. 317
G.L. Catchen, MRS Bull. 20, 37 (1995)
Th. Wichert, Identification of Defects in Semiconductors. Semiconductors and Semimetals, Vol. 51B, ed. M. Stavola (London: Academic Press, 1998/1999), p. 297
Thomas Wichert, Manfred Deicher, Nucl. Phys. A 693, 327 (2001).doi:10.1016/S0375-9474(00)00688-6
M. Deicher, Hyp. Int. 79, 681 (1993).doi:10.1007/BF00567596
Th. Wichert and M. L. Swanson, J. Appl. Phys. 66, 3026 (1989)doi:10.1063/1.344188
Th. Wichert, M.L. Swanson and A.F. Quenneville, Phys. Rev. Lett. 57, 1757 (1986).doi:10.1103/PhysRevLett.57.1757
G. Tessema, R. Vianden, Appl. Phys. A 81, 1471 (2005).doi:10.1007/s00339-005-3249-6
H. Haesslein, R. Sielemann, and Ch. Zistl, Phys. Rev. Lett. 80, 2626 (1998).doi:10.1103/PhysRevLett.80.2626
G. Tessema, R. Vianden, J. Phys. Condens. Matter 15, 5297 (2003).doi:10.1088/0953-8984/15/30/311
V. Ostheimer, S. Lany, J. Hamann, H. Wolf, Th. Wichert, and ISOLDE Collaboration, Phys. Rev. B 68, 235206 (2003). doi:10.1103/PhysRevB.68.235206
J. C. Austin, Wm. C. Hughes, B. K. Patnaik, R. Triboulet, and M. L. Swanson; J. Appl. Phys. 86, 3576 (1999)doi:10.1063/1.371261
K. Lorenz, F. Ruske, and R. Vianden, Appl. Phys. Lett. 80, 4531 (2002).doi:10.1063/1.1485117
M. Risse and R. Vianden, J. Appl. Phys. 93, 2648 (2003).doi:10.1063/1.1539288
R. Keller, M. Deicher, W. Pfeiffer, H. Skudlik, D. Steiner, Th. Wichert, Phys. Rev. Lett. 65, 2023 (1990).doi:10.1103/PhysRevLett.65.2023
H. Skudlik, M. Deicher, R. Keller, R. Magerle, W. Pfeiffer, P. Pross, E. Recknagel, Th. Wichert, Phys. Rev. B 46, 2159 (1992).doi:10.1103/PhysRevB.46.2159
M. Gebhard, B. Vogt and W. Witthuhn Phys. Rev. Lett. 67, 847 (1991)doi:10.1103/PhysRevLett.67.847
M. Deicher and W. Pfeiffer, Hydrogen in Compound Semiconductors, ed. S.J. Pearton (Material Science Forum 148–149, Trans Tech Publications, 1994), p. 481
J.M. Adam, G. L. Catchen, J. Fu and D. L. Miller, Surf. Sc. 337, 118 (1995).doi:10.1016/0039-6028(95)00532-3
G.L.Catchen, D. Loubychev and R. Platzer, Hyp. Int. 136/137, 633 (2001).doi:10.1023/A:1020586808228
J. Lohmuller, H·H. Bertschat, H. Granzer, H. Haas, G. Schatz, W.-D. Zeitz, ISOLDE Collaboration, Surf. Sci. 360, 213 (1996).doi:10.1016/0039-6028(96)00682-6
Th. Agne, Z. Guan, X. M. Li, H. Wolf, and Th. Wichert, H. Natter and R. Hempelmann, Appl. Phys. Lett. 83, 1204 (2003).doi:10.1063/1.1598289
W. Sato, Y. Itsuki, S. Morimoto, H. Susuki, S. Nasu, A. Shinohara, and Y. Ohkubo, Phys. Rev. B 78, 045319 (2008).doi:10.1103/PhysRevB.78.045319
N. Santen and R. Vianden, Mater. Sci. Eng. B 154–155, 126 (2008)
L. Hemmingsen and T. Butz, Application of Physical Methods to Inorganic and Bioinorganic Chemistry. Encyclopedia of Inorganic Chemistry Books, ed. R.A. Scott (2007)
Y. Ohkubo, Y. Murakami, W. Sato and A. Yokoyama; J. Nucl. Radiochem. Sci. 8, 79 (2007)
S. Zhu, Y. Zheng, Y. Zuo, D. Zhou, D.Yuan, A. Li, Z. Wang, X. Duan, M.Liu and Y. Li, J. Radioanal. Nucl. Chem. 272, 615 (2007).doi:10.1007/s10967-007-0634-y
G.S. Collins, S.L. Shropshire, J. Fan, Hyp. Int. 62, 1 (1990).doi:10.1007/BF02407659
H·H. Bertschat, K. Potzger, A. Weber, W.-D. Zeitz, Eur. Phys. J. A 13, 233 (2002)
L. G. Shpinkova, A. A. Sorokin, B. A. Komissarova, G. K. Ryasnyi, V. N. Kulakov and S. M. Nikitin, Meas. Tech. 42, 490 (1999).doi:10.1007/BF02504474
A.W. Carbonari, J. Mestnik, R.N. Saxena, R. Dogra, J. A. H. Coaquira, Hyp. Int. 136, 345 (2001).doi:10.1023/A:1020533708556
R. Dogra, A. C. Junqueira, R. N. Saxena, A. W. Carbonari, J. Mestnik-Filho, and M. Moralles, Phys. Rev. B 63, 224104 (2001).doi:10.1103/PhysRevB.63.224104
H.E. Mahnke, Nucl. Phys. A 588, 221c (1995). doi:10.1016/0375-9474(95)00143-O
A. Baudry, P. Boyer and P. Vulliet, Hyp. Int. 13, 263 (1983).doi:10.1007/BF01027256
M. Balcerzyk, M. Moszynski, M. Kapusta, Nucl. Inst. Methods A 537, 50 (2005).doi:10.1016/j.nima.2004.07.233
S.-b. Ryu, S·K. Das, and T. Butz, Phys. Rev. B 77, 094124 (2008).doi:10.1103/PhysRevB.77.094124
C. Herden, J. Röder, J.A. Gardner, K.D. Becker, Nucl. Inst. Methods A 594, 155 (2008).10.1016/j.nima.2008.05.001
A. R. Arends, C. Hohenemser, F. Pleiter, H. de Waard, L. Chow and R. M. Suter, Hyp. Int. 8, 191 (1980). doi:10.1007/BF01026869
D.A. Brett, R. Dogra, A.P. Byrne, J. Mestnik-Filho, M. C. Ridgway, Phys. Rev. B 72, 193202 (2005). doi:10.1103/PhysRevB.72.193202
R. Dogra, D.A. Brett, A.P. Byrne and M.C. Ridgway, Hyp. Int. 33, 177 (2007)
R. Dogra, S.K. Shrestha, A.P. Byrne, M.C. Ridgway, A.V.J. Edge, R. Vianden, J. Penner, and H. Timmers, J. Phys. Condens. Matter 17, 6037 (2005)
N. Achtziger, S. Deubler, D. Forkel, H. Wolf, W. Witthuhn, Appl. Phys. Lett. 55, 766 (1989). doi:10.1063/1.102265
R. Dogra, A.P. Byrne, and M.C. Ridgway, Opt. Mater. (2009) (accepted)
R. Dogra, Z.S. Hussain, A.K. Sharma, Mater. Charact. 58, 652 (2007). doi:10.1016/j.matchar.2006.07.014
E. Bezakova, A.P. Byrne, C.J. Glover, M.C. Ridgway, and R. Vianden, Appl. Phys. Lett. 75, 1923 (1999).doi:10.1063/1.124872
R. Dogra, A.P. Byrne, Z.S. Hussain and M.C. Ridgway, Nucl. Instr. Methods B 266, 1460 (2008).doi:10.1016/j.nimb.2007.11.058
R. Dogra, A.P. Byrne, L.L. Araujo and M.C. Ridgway, Nucl. Instr. Methods B 257, 355 (2007). doi:10.1016/j.nimb.2007.01.137
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Open Access This is an open access article distributed under the terms of the Creative Commons Attribution Noncommercial License ( https://creativecommons.org/licenses/by-nc/2.0 ), which permits any noncommercial use, distribution, and reproduction in any medium, provided the original author(s) and source are credited.
About this article
Cite this article
Dogra, R., Byrne, A. & Ridgway, M. The Potential of the Perturbed Angular Correlation Technique in Characterizing Semiconductors. J. Electron. Mater. 38, 623–634 (2009). https://doi.org/10.1007/s11664-009-0658-x
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-009-0658-x