Journal of Electronic Materials

, Volume 37, Issue 9, pp 1356–1361 | Cite as

Effects of Surface Processing on the Response of CZT Gamma Detectors: Studies with a Collimated Synchrotron X-Ray Beam

  • A. Hossain
  • A.E. Bolotnikov
  • G.S. Camarda
  • Y. Cui
  • S. Babalola
  • A. Burger
  • R.B. James
Article

Using a microscale X-ray mapping technique incorporating a synchrotron beam, we are able to reveal the fine details of the surface properties in cadmium zinc telluride (CZT) semiconductor detectors. A detector, with various degrees of surface roughness, was irradiated by a high-spatial-resolution X-ray beam. The detector’s response was analyzed and displayed as a two-dimensional (2-D) map, and the charge collection was obtained from the peak positions in the spectra versus the beam’s location, which reflects the local material properties. We noted the correlation between the 2-D image and the spectral response of the charge collection at different locations on the surface area, which indicates that a rough surface tends to contain trapping centers, thereby enhancing leakage current and distorting the signal. We also discuss our observations on the transition effect at the boundary area of a rough and a smooth surface under identical conditions.

Keywords

CZT surface roughness microcharacterization leakage current surface polishing 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Y. Cui, M. Groza, A. Burger, R.B. James, IEEE Trans. Nucl. Sci. NS-51 (2004) 1172CrossRefGoogle Scholar
  2. 2.
    G. Zha, W. Jie, T. Tan, X. Wang, Nucl. Inst. Meth. A566 (2006) 495Google Scholar
  3. 3.
    L. Yu, H. Huang, J. Qun, H. Chen, G. Wu, C. Liu, Proc. SPIE, 3553, 1998, 61CrossRefGoogle Scholar
  4. 4.
    A. Burger, H. Chen, K. Chattopadhyay, D. Shi, S.H. Morgan, W.E. Collins, R.B. James, Nucl. Instr. Meth. A428 (1999) 8Google Scholar
  5. 5.
    T.H. Prettyman, F.P. Ameduri, A. Burger, J.C. Gregory, M.A. Hoffbauer, P.R. Majerus, D.B. Reisenfeld, S.A. Soldner, Cs. Szeles, Proc. SPIE 4507, 2001, 23CrossRefGoogle Scholar
  6. 6.
    G.A. Carini, A.E. Bolotnikov, G.S. Camarda, G.W. Wright, G. De Geronimo, D.P. Siddons, R.B. James, IEEE Trans. Nucl. Sci. NS-52 (2005) 1941CrossRefGoogle Scholar
  7. 7.
    B.A. Brunett, J.M. Van Scyoc, N.R. Hilton, J.C. Lund, R.B. James, T.E. Schlesinger, IEEE Trans. Nucl. Sci. NS-46 (1999) 237CrossRefGoogle Scholar
  8. 8.
    B.A. Brunett, J.M. Van Scyoc, T.E. Schlesinger, R.B. James, Nucl. Inst. Meth. A 458 (2001) 76CrossRefGoogle Scholar
  9. 9.
    G.S. Camarda, A.E. Bolotnikov, G.A. Carini, Y. Cui, K.T. Kohman, L. Li, R.B. James, Proc. SPIE 6319 (2006) 1Google Scholar
  10. 10.
    H. Chen, M.A. George, K. Chattopadhyay, J.C. Gregory, K.T. Chen, A. Burger, P. Nag, R.B. James, J. Vac. Sci. Technol. A, 17, 1999, 97CrossRefGoogle Scholar
  11. 11.
    A. Ruzin, Y. Nemirovsky, Appl. Phys. Lett. 71, 1997, 2214CrossRefGoogle Scholar
  12. 12.
    G. Tepper, R. Kessick, Cs. Szeles, Proc. SPIE 4507, 2001, 79CrossRefGoogle Scholar
  13. 13.
    H. Chen, J. Tong, Z. Hu, D.T. Shi, G.H. Wu, K.T. Chen, M.A. George, W.E. Collins, A. Burger, R.B. James, C.M. Stahle, L.M. Bartlett, J. Appl. Phys. 80 1996, 3509CrossRefGoogle Scholar
  14. 14.
    A.E. Bolotnikov, G.S. Camarda, G.A. Carini, Y. Cui, L. Li, and R.B. James, Nucl. Instr. Meth. A (accepted on 3 Nov. 2006, available online 28 Nov. 2006)Google Scholar
  15. 15.
    G.A. Carini, A.E. Bolotnikov, G.S. Camarda, G.W. Wright, G. De Geronimo, D.P. Siddons, R.B. James, IEEE Trans. Nucl. Sci. NS-52 (2005) 1941CrossRefGoogle Scholar
  16. 16.
    G.A. Carini, A.E. Bolotnikov, G.S. Camarda, G.W. Wright, L. Li, R.B. James, Appl. Phys. Lett. 88 (2006) 143515CrossRefGoogle Scholar
  17. 17.
    Scientific Software, http://www.certif.com, 2006
  18. 18.
    L. Longxia, Yinnel Tech., personal correspondence, 2007Google Scholar
  19. 19.
    Linear Attenuation Coefficient data, http://www.amptek.com/anczt1.html, 2007
  20. 20.
    S.H. Park, Y.K. Kim, and H.S. Kim, N35-57, IEEE Nuclear Science Symposium Conference Record, 2005Google Scholar
  21. 21.
    H.S. Kim, S.H. Park, Y.K. Kim, J.H. Ha, S.M. Kang, S.Y. Cho, submitted to Nucl. Instr. Meth. A (2007), doi: 10.1016/j.nima.2007.04.021 (article in press)
  22. 22.
    K. Hecht, Z. Phys. Title 77 (1932) 235CrossRefGoogle Scholar
  23. 23.
    G.F. Knoll, Radiation Detection and Measurement, Wiley, New York (2000)Google Scholar

Copyright information

© TMS 2008

Authors and Affiliations

  • A. Hossain
    • 1
  • A.E. Bolotnikov
    • 1
  • G.S. Camarda
    • 1
  • Y. Cui
    • 1
  • S. Babalola
    • 2
  • A. Burger
    • 2
  • R.B. James
    • 1
  1. 1.Brookhaven National LaboratoryUptonUSA
  2. 2.Fisk UniversityNashvilleUSA

Personalised recommendations