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On the Nature of the Interface between Ag3Sn Intermetallics and Sn in Sn-3.5Ag Solder Alloys

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We report on the nature of the orientation of Ag3Sn and the Ag3Sn/Sn interface in Sn-3.5Ag solder. Orientation imaging microscopy (OIM) and transmission electron microscopy (TEM) were used to characterize the orientation and nature of the interface, respectively. OIM and TEM showed that Sn-3.5Ag containing spherical Ag3Sn particles does not have a preferred orientation with respect to the Sn matrix. However, needle-like Ag3Sn formed during slower cooling appeared to have a preferred orientation within individual Sn colonies. The interface between Sn and Ag3Sn appeared to be incoherent, as confirmed by high-resolution TEM analysis.

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The authors gratefully acknowledge financial support for support of this research from the National Science Foundation under Contract #DMR-0092530 (Drs. H. Chopra, S. Ankem, B. MacDonald, and K.L.␣Murty, Program Managers).

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Correspondence to Nikhilesh Chawla.

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Sidhu, R.S., Madge, S.V., Deng, X. et al. On the Nature of the Interface between Ag3Sn Intermetallics and Sn in Sn-3.5Ag Solder Alloys. J. Electron. Mater. 36, 1615–1620 (2007).

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