The impact of light and controlled gas ambient on the electrical characteristics of ZnO:P grown by pulsed laser deposition (PLD) is investigated with temperature-dependent Hall-effect and photo-Hall-effect using above-bandgap light. Exposure to blue/ultraviolet (UV) light results in long-lived persistent photoconductivity (PPC) effects dominated by electron conduction. However, these persistent effects can be largely reversed by exposing the sample to a controlled ambient of dry O2 gas. These O2-induced changes in the electronic properties persist in vacuum up to at least 400 K. Exposure to dry N2 gas following blue/UV light has no effect on the observed PPC characteristics. The implications of these effects on the preparation of p-type ZnO will be discussed.
Similar content being viewed by others
References
K. Minegishi, Y. Koiwai, K. Kikuchi, Jpn. J. Appl. Phys. 36, L1453 (1997)
Y.R. Ryu, S. Zhu, D.C. Look, J.M. Wrobel, H.M. Jeong, H.W. White, J. Cryst. Growth 216, 330 (2000)
D.C. Look, D.C. Reynolds, C.W. Litton, R.L. Jones, D.B. Eason, G. Cantwell, Appl. Phys. Lett. 81, 1830 (2002)
K.-K. Kim, H.-S. Kim, D.-K. Hwang, J.-H. Lim, S.-J. Park, Appl. Phys. Lett. 83, 63 (2003)
D.C. Look, G.M. Renlund, R.H. Burgener, J.R. Sizelove, Appl. Phys. Lett. 85, 5269 (2004)
Y.W. Heo, K. Ip, S.J. Park, S.J. Pearton, D.P. Norton, Appl. Phys. A 78, 53 (2004)
D.K. Hwang, S.H. Kang, J.H. Lim, E.J. Yang, J.Y. Oh, J.H. Yang, S.J. Park, Appl. Phys. Lett. 86, 222101 (2005)
C.H. Park, S.B. Zhang, S.H. Wei, Phys. Rev. B 66, 073202 (2002)
S. Limpijumnong, S.B. Zhang, S.-H. Wei, C.H. Park, Phys. Rev. Lett. 92, 155504 (2004)
D.B. Laks, C.G. Van de Walle, G.F. Neumark, S.T. Pantelides, Appl. Phys. Lett. 63, 1375 (1993)
B.K. Meyer et al. Phys. Status Solidi B 241, 231 (2004)
B. Claflin, D.C. Look, S.J. Park, G. Cantwell, J. Cryst. Growth 287, 16 (2006)
O. Schmidt, P. Kiesel, C.G. Van de Walle, N.M. Johnson, J. Nause, G.H. Döhler, Jpn. J. Appl. Phys. 1 44, 7271 (2005)
O. Schmidt, A. Geis, P. Kiesel, C.G. Van de Walle, N.M. Johnson, A. Bakin, A. Waag, G.H. Döhler, Superlattice Microstruct. 39, 8 (2006)
H. Moormann, D. Kohl, G. Heiland, Surf. Sci. 100, 302 (1980)
J.Q. Xu, Q.Y. Pan, Y.A. Shun, Z.Z. Tian, Sensor Actuat. B-Chem. 66, 277 (2000)
F. Paraguay D., M. Miki-Yoshida, J. Morales, J. Solis, W. Estrada L., Thin Solid Films 373, 137 (2000)
D.J. Leary, J.O. Barnes, A.G. Jordan, J. Electrochem. Soc. 129, 1382 (1982)
D.C. Look, Electrical Characterization of GaAs Materials and Devices (New York: Wiley, 1989), p. 87
Acknowledgements
We thank T.A. Cooper and W. Rice for technical assistance. Support for BC and DCL has been provided by AFOSR (D. Silversmith) and ARO (M. Gerhold).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Claflin, B., Look, D.C. & Norton, D.R. Changes in Electrical Characteristics of ZnO Thin Films Due to Environmental Factors. J. Electron. Mater. 36, 442–445 (2007). https://doi.org/10.1007/s11664-006-0063-7
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-006-0063-7