Abstract
The firing atmosphere (air, oxygen, and argon) was found to affect the electrical and mechanical properties of an air-fireable electrically conductive glass-free silver-based thick film. For the optimum firing temperature of 930°C, air results in the lowest resistivity, but a minor amount of pinholes; oxygen results in the largest thickness, the smoothest surface, and no pinhole; and argon results in the highest resistivity, large pinholes, the smallest thickness, vanishing of macroscopic parts of the film, and the poorest scratch resistance. Argon gives higher resistivity than air or oxygen at essentially all firing temperatures.
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References
M. Prudenziati, Thick Film Sensors (Amsterdam, Netherlands: Elsevier Science B.V., 1994), vol. 1, p. 73.
Morton L. Topfer, Thick-Film Microelectronics Fabrication, Design and Applications (New York: Van Nostrand Reinhold Company, 1971), pp. 46–58.
D.W. Hamer and J.V. Biggers, Thick Film Hybrid Micro-circuit Technology (New York: Wiley-Interscience, 1972) pp. 69–90.
C.J.M. Lasance, H. Vinke, and H. Rosten, Packaging Manufacturing Technol. 18, 1 (1995).
M. Novotny, Precious Metals 1983 (San Francisco, CA: Pergamon Press Inc., 1984), p. 69.
S.G. Yu (Paper presented at Precious Metals 1987, Brussels, Belgium: Pergamon Press Inc., 1987), pp. 14–15.
Zongrong Liu and D.D.L. Chung, J. Electron. Packaging 123, 64 (2001).
Mingguang Zhu and D.D.L. Chung, J. Electron. Mater. 23, 541 (1994).
R. Reicher, W. Smetana, E.U. Gruber, and J. C. Schuster, J. Mater. Sci. Mater. Electron. 9, 429 (1998).
A. Adlaßnig, J.C. Schuster, R. Reicher, and W. Smetana, J. Mater. Sci. 33, 4887 (1998).
Sunit Rane, Vijaya Puri, and Dinesh Amalnerkar, J. Mater. Sci. Mater. Electron. 11, 667 (2000).
T. Takashima, K. Nakayama, T. Yamamoto, and T. Narita, J. Ceram. Soc. Jpn. 108, 510 (2000).
A.H. Carim and R.E. Loehmann, J. Mater. Res. 5, 1520 (1990).
R. Reicher, W. Smetana, E.U. Gruber, and J.C. Schuster, J. Mater. Sci. Mater. Electron. 9, 429 (1998).
S.J. Stein, C. Huang, and L. Cang, Solid State Technol. 24, 73 (1981).
T.R. Bloom, Patent EP 0558841A1 (1992).
F. Sirotti, M. Prudenziati, T. Manfredini, B. Giardullo, and W. Anzolin, J. Mater. Sci. 25, 4688 (1990).
Y.G. Wang, G.N. Zhang, and J.S. Ma, Mater. Sci. Eng. B 94, 48 (2002).
Zongrong Liu and D.D.L. Chung, J. Electron. Mater. 30, 1458 (2001).
S.J. Lee, W.M. Kriven, J.H. Park, and Y.S. Yoon, J. Mater. Res. 12, 2411 (1997).
D.R. Sample, P.W. Brown, and J.P. Dougherty, J. Am. Ceram. Soc. 79, 1303 (1996).
Zongrong Liu and D.D.L. Chung, J. Electron. Mater. 33, 194 (2004).
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Liu, Z., Chung, D.D.L. Effect of firing atmosphere on air-fireable glass-free electrically conductive thick film. J. Electron. Mater. 34, 287–293 (2005). https://doi.org/10.1007/s11664-005-0215-1
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DOI: https://doi.org/10.1007/s11664-005-0215-1