Abstract
A novel lead-free interconnect technique using variable frequency microwave (VFM) was investigated. The lead-free solder interconnection between the component chips and the metal pads through VFM was first demonstrated. Comparison between the microstructures of the lead-free solder joints on Cu and Sn surfaces formed by a conventional thermal reflow process and VFM was conducted. The VFM heating technique successfully created the lead-free solder/Cu and Sn joints through their intermetallic compounds (IMCs), while maintaining the substrate temperature as low as 210°C.
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References
M. Abtew and G. Selvaduray, Mater. Sci. Eng. 27, 95 (2000).
J. Glazer, J. Electron. Mater. 23, 693 (1994).
F. Bartels and J.W. Morris, Jr., J. Electron. Mater. 23, 787 (1994).
D. Yao and J.K. Shang, IEEE Trans. Component Hybrids Manufacturing Technol. B 19, 154 (1996).
L.E. Felton, C.H. Reader, and D.B. Knorr, J. Met. 45, 28 (1993).
M. McCormack and S. In, J. Met. 5, 36 (1993).
J. Glazer, Int. Mater. Rev. 40, 65 (1995).
H.K. Kim and K.N. Tu, Phys. Rev. B 53, 16027 (1996).
H. Noh, K.S. Moon, A Cannon, P.J Hesketh, and C.P. Wong, J. Micromechan. Microeng. 14, 625 (2003).
P.F. Mead, A. Ramamoorthy, S. Pal, Z. Fathi, and I. Ahmad, J. Electron. Packaging, 125, 302 (2003).
G.Y. Li and B.L. Chen, IEEE Trans. Comp. Packaging Technol. 26, 651 (2003).
K.S. Kim, S.H. Huh, and K. Suganuma, J. Alloys Compounds 352, 226 (2003).
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Moon, KS., Li, Y., Xu, J. et al. Lead-free interconnect technique by using variable frequency microwave. J. Electron. Mater. 34, 1081–1088 (2005). https://doi.org/10.1007/s11664-005-0099-0
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DOI: https://doi.org/10.1007/s11664-005-0099-0