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Reflow and burn-in of a Sn-20In-0.8Cu ball grid array package with a Au/Ni/Cu pad

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Abstract

The intermetallic compounds formed after reflow and burn-in testing of a Sn-20In-0.8Cu solder ball grid array (BGA) package are investigated. Along with the formation of the Cu6(Sn0.78In0.22)5 precipitates (IM1) in the solder matrix, scallop-shaped intermetallic compounds (IM2) with a compositional mixture of Cu6(Sn0.87In0.13)5 and Ni3(Sn0.87In0.13)4 appear at the interfaces between the solder balls and Au/Ni/Cu pads. A significant number of intermetallic particles (IM3), with a composition of (Au0.80Cu0.20)(In0.33Sn0.67)2, can also be found in the solder matrix. After aging at 115°C for 750 h, an additional intermetallic compound layer (IM4) with a composition of (Ni0.91Cu0.09)3(Sn0.77In0.23)2 is formed at the interface between IM2 and the Ni layer. The ball shear strength of the Sn-20In-0.8Cu BGA solder after reflow is 4.5 N and will rise to maximum values after aging at 75°C and 115°C for 100 h. With a further increase of the aging time at both temperatures, the joint strengths exhibit a tendency to decline linearly at about 1.7×10−3 N/h.

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Authors and Affiliations

  1. Institute of Materials Science and Engineering, National Taiwan University, 106, Taipei, Taiwan

    M. J. Chiang, S. Y. Chang & T. H. Chuang

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  1. M. J. Chiang
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  2. S. Y. Chang
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  3. T. H. Chuang
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Chiang, M.J., Chang, S.Y. & Chuang, T.H. Reflow and burn-in of a Sn-20In-0.8Cu ball grid array package with a Au/Ni/Cu pad. J. Electron. Mater. 33, 34–39 (2004). https://doi.org/10.1007/s11664-004-0291-7

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  • DOI: https://doi.org/10.1007/s11664-004-0291-7

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