Abstract
We present greatly increased lateral oxidation rates for AlInAs grown as a short-period superlattice of InAs and AlAs compared to the analog alloy. The tensile strain in the AlAs layers is balanced by the compressive strain in the InAs layers, creating a strain-compensated alloy lattice-matched to InP. Oxidation layers with superlattice periods up to 40 Å and cladded by lattice-matched InGaAs layers were grown on InP substrates and laterally oxidized at temperatures ranging from 450°C to 525°C. The oxidation depth for a given time and temperature was seen to increase with superlattice period, allowing increased oxidation depths or reduced oxidation temperatures compared to the analog alloy. Oxidized layers were examined with transmission electron microscopy and were found to retain some of the superlattice structure.
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Hall, E., Huntington, A., Naone, R.L. et al. Increased lateral oxidation rates of AllnAs on InP using short-period superlattices. J. Electron. Mater. 29, 1100–1104 (2000). https://doi.org/10.1007/s11664-004-0271-y
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DOI: https://doi.org/10.1007/s11664-004-0271-y