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Optical properties of CdSexTe1−x epitaxial films studied by spectroscopic ellipsometry

Journal of Electronic Materials volume 33, pages 724–727 (2004)Cite this article

Abstract

We have determined the dielectric constants for a series of CdSexTe1−x thin films grown on Si substrates using a rotating-analyzer spectroscopic ellipsometer. Initially, the alloy concentration and the sample quality were determined using x-ray diffraction. A standard inversion technique was then used to obtain the dielectric constants from the measured ellipsometric spectra. Using these calculated absorption spectra, we were able to estimate the fundamental bandgap for these CdSexTe1−x alloys. In addition, we also determined the dispersion of the indices of refraction as well as the critical points related to the higher-order electronic transitions for this alloy.

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References

  1. Y.P. Chen, G. Brill, and N.K. Dhar, J. Cryst. Growth 252, 270 (2003).

    Article  CAS  Google Scholar 

  2. N. Matsumura, T. Sakamoto, and J. Saraie, J. Cryst. Growth 251, 602 (2003).

    Article  CAS  Google Scholar 

  3. D. Noda, T. Aoki, Y. Nakanishi, and Y. Hatanaka, J. Cryst. Growth 214/215, 1121 (2000).

    Article  CAS  Google Scholar 

  4. Z.C. Feng, P. Becla, L.S. Kim, S. Perkowitz, Y.P. Feng, H.C. Poon, K.P. Williams, and G.D. Pitt, J. Cryst. Growth 138, 239 (1994).

    Article  CAS  Google Scholar 

  5. P. Lautenschlager, S. Logothetidis, L. Vina, and M. Cardona, Phys. Rev. B 32, 3811 (1985).

    Article  CAS  Google Scholar 

  6. F.C. Peiris, S. Lee, U. Bindley, and J.K. Furdyna, J. Appl. Phys. 86, 918 (1999).

    Article  CAS  Google Scholar 

  7. H. Jeon, J. Ding, A.V. Nurmikko, H. Luo, N. Samarth, and J.K. Furdyna, Appl. Phys. Lett. 59, 1293 (1991).

    Article  CAS  Google Scholar 

  8. M.R. Buckley, F.C. Peiris, O. Maksimov, M. Munoz, and M.C. Tamargo, Appl. Phys. Lett. 81, 5156 (2002).

    Article  CAS  Google Scholar 

  9. H. Lee, S.M. Kim, B.Y. Seo, E.Z. Seong, S.H. Choi, S. Lee, and J.K. Furdyna, Appl. Phys. Lett. 77, 2997 (2000).

    Article  CAS  Google Scholar 

  10. P.M. Amirtharaj, Y. Chen, G. Brill, P.R. Boyd, W. Sarney, and N.K. Dhar, unpublished research.

  11. E.D. Palik, ed., Handbook of Optical Constants of Solids (San Diego, CA: Academic Press, 1998).

    Google Scholar 

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Authors and Affiliations

  1. Department of Physics, Kenyon College, 43022, Gambier, OH

    F. C. Peiris & Z. J. Weber

  2. United States Army Research Laboratory, 20783, Adelphi, MD

    Y. Chen & G. Brill

Authors
  1. F. C. Peiris
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  2. Z. J. Weber
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  3. Y. Chen
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  4. G. Brill
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Peiris, F.C., Weber, Z.J., Chen, Y. et al. Optical properties of CdSexTe1−x epitaxial films studied by spectroscopic ellipsometry. J. Electron. Mater. 33, 724–727 (2004). https://doi.org/10.1007/s11664-004-0073-2

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  • DOI: https://doi.org/10.1007/s11664-004-0073-2

Key words

  • CdSexTe1−x
  • ellipsometry
  • optical properties

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