Abstract
Growth of single crystal wurtzite cadmium sulfide on CdTe(111)B substrates has been achieved using molecular beam epitaxy. Reflection high-energy electron diffraction (RHEED) indicates smooth surface morphology for several hundreds of nanometers after nucleation. X-ray diffraction measurements confirm the crystalline orientation to be [0001] in the growth direction. X-ray photoelectron spectroscopy (XPS) indicates mostly stoichiometric CdS layers and the existence of a reaction at the interface. Sulfur incorporation into CdTe for various S fluxes has been investigated by Auger electron spectroscopy (AES). High-resolution TEM images of the interface between such epilayers were recorded. During the growth In was used as an in-situ dopant. The concentration and uniformity of In was determined by secondary ion mass spectrometry. Indium profiles were obtained for concentrations ranging from 5 × 1017 to 1.4 × 1021 cm−3. The experimental concentration agrees well with the variation expected from the In flux.
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K. Li, A.T.S. Wee, J. Lin, K.L. Tan, L. Zhou, S.F.Y. Li, Z.C. Feng, H.C. Chou, S. Kamara, and A. Rohatgi, J. Mater. Sci.-Mater. in Electron, 8, 125 (1997).
W.G. Wilke, R. Seedorf, and K. Horn, J. Vac. Sci. Technol. B 8, 807 (1989).
D.W. Niles and H. Höchst, Phys. Rev. B 41, 12710 (1990).
R. Sporken, S. Sivananthan, K.K. Mahavadi, G. Monfroy, M. Boukerche, and J.P. Faurie, Appl. Phys. Lett. 55, 1879 (1989); Y.P. Chen J.P. Faurie, S. Sivananthan, G.C. Hua, and N. Otsuka, J. Electron. Mater. 24, 475 (1995).
Y. Xin, S. Rujirawat, N.D. Browning, R. Sporken, S. Sivananthan, S.J. Pennycock, and N.K. Dhar, Appl. Phys. Lett. 75, 349 (1999).
P. Staib, J. Phys. E 5, 484 (1971); P. Staib and U. Dinklage, J. Phys. E 10, 914 (1977).
P. Boieriu, R. Sporken, Y. Xin, N.D. Browning, A. Subrahmanyan, and S. Sivananthan, to be published.
P. Boieriu, R. Sporken, A. Adriaens, Y. Xin, N.D. Browning, and S. Sivananthan, J. Nucl. Meth. and Instr. (in press).
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Boieriu, P., Sporken, R., Xin, Y. et al. Wurtzite CdS on CdTe grown by molecular beam epitaxy. J. Electron. Mater. 29, 718–722 (2000). https://doi.org/10.1007/s11664-000-0212-3
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DOI: https://doi.org/10.1007/s11664-000-0212-3