Skip to main content
Log in

Volume Shrinkage Induced by Interfacial Reaction in Micro-Ni/Sn/Ni Joints

  • Communication
  • Published:
Metallurgical and Materials Transactions A Aims and scope Submit manuscript

Abstract

Experiments are carried out to measure the volume shrinkage during solid-state reaction in micro-joints for three-dimensional integrated circuit applications. Surface profilometer is employed to measure the volume shrinkage for the reaction between Ni and Sn. The shrinkage is correlated with the microstructural evolution during the reaction. It is found that the volume shrinkage is released through both joint height reduction and void formation. The resulting internal stress and the void formation might post potential reliability issues.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5

Similar content being viewed by others

References

  1. H. Y. Chuang, T. L. Yang, M. S. Kuo, Y. J. Chen, J. J. Yu, C. C. Li, and C. R. Kao: IEEE Trans. Device Mater. Rel., 2012, vol. 12, no. 2, pp. 233-240.

    Article  Google Scholar 

  2. K. Kulojärvi, V. Vuorinen, and J. Kivilahti: Microelectron. Int., 1998, vol. 15, no. 2, pp. 20-24.

    Article  Google Scholar 

  3. W.M. Chen, T.L. Yang, C.K. Chung, and C.R. Kao: Scripta Mater., 2011, vol. 65, no. 4, pp. 331-334.

    Article  Google Scholar 

  4. H.Y. Chuang, J.J. Yu, M.S. Kuo, H.M. Tong, and C.R. Kao: Scripta Mater., 2012, vol. 66, no. 3-4, pp. 171-174.

    Article  Google Scholar 

  5. C. E. Ho, S. C. Yang, and C. R. Kao: J. Mater. Sci.-Mater. El., 2007, vol. 18, no. 1-3, pp. 155-174.

    Google Scholar 

  6. P. R. Frederikse, R.J. Fields, and A. Feldman: J. Appl. Phys., 1992, vol. 72, no.7, pp. 2879-2882.

    Article  Google Scholar 

  7. W.M. Haynes and D.R. Lide: Handbook of Chemistry and Physics, 92nd ed., CRC Press, New York, NY, 2012.

    Google Scholar 

  8. M. E. Glicksman: Diffusion in Solids: Field Theory, Solid-State Principles and Applications, p. 79, Wiley, New York, NY, 2000.

    Google Scholar 

  9. J. A. van Beek, S. S. Stolk, and F. J. J. van Loo: Z. Metallk., 1982, vol. 73, pp. 439-444.

    Google Scholar 

  10. C. M. Chen, and S. W. Chen: Acta Mater., 2002, vol. 50, pp. 2461-2469.

    Article  Google Scholar 

  11. G. F. V. Voort: ASM Handbook: Volume 9: Metallography And Microstructures, 9th ed., p. 123, ASM International, Materials Park, OH, 1985.

    Google Scholar 

Download references

This work is supported by National Science Council of Taiwan through Grant 101-2221-E-002-162-MY3, and by National Taiwan University through Grant 10R80920-04.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to C. R. Kao.

Additional information

Manuscript submitted September 13, 2012.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Li, C.C., Chung, C.K., Shih, W.L. et al. Volume Shrinkage Induced by Interfacial Reaction in Micro-Ni/Sn/Ni Joints. Metall Mater Trans A 45, 2343–2346 (2014). https://doi.org/10.1007/s11661-014-2263-8

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11661-014-2263-8

Keywords

Navigation