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Ultra-Small-Angle X-ray Scattering—X-ray Photon Correlation Spectroscopy: A New Measurement Technique for In-Situ Studies of Equilibrium and Nonequilibrium Dynamics

  • Symposium: Neutron and X-Ray Studies of Advanced Materials IV
  • Published:
Metallurgical and Materials Transactions A Aims and scope Submit manuscript

Abstract

Ultra-small-angle X-ray scattering—X-ray photon correlation spectroscopy (USAXS-XPCS) is a new measurement technique for the study of equilibrium and slow nonequilibrium dynamics in disordered materials. This technique fills a gap between the accessible scattering vector ranges of dynamic light scattering (DLS) and XPCS. It also overcomes the limits of visible light scattering techniques imposed by multiple scattering and is suitable for the study of optically opaque materials containing near-micrometer-sized structures. In this article, we present an overview of the important technical aspects of USAXS-XPCS and offer a few examples as well as future outlooks to illustrate the capability of USAXS-XPCS for monitoring equilibrium and nonequilibrium dynamics.

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Notes

  1. Certain trade names and company products are mentioned in the text or identified in illustrations in order to specify adequately the experimental procedure and equipment used. In no case does such identification imply recommendation or endorsement by National Institute of Standards and Technology, nor does it imply that the products are necessarily the best available for the purpose.

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Acknowledgments

We thank J.M. Antonucci, D. Skrtic, and J.N.R. O’Donnell, NIST’s Polymers Division, for preparing the dental composite samples. ChemMatCARS Sector 15 is principally supported by the National Science Foundation/Department of Energy under Grant No. NSF/CHE-0822838. Use of the Advanced Photon Source, an Office of Science User Facility operated for the United States Department of Energy (U.S. DOE) Office of Science by Argonne National Laboratory, was supported by the U.S. DOE under Contract No. DE-AC02-06CH11357.

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Authors and Affiliations

  1. National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA

    F. Zhang (Research Associate, Adjunct Research Physicist)

  2. Northern Illinois University, DeKalb, IL, 60115, USA

    F. Zhang (Research Associate, Adjunct Research Physicist)

  3. Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA

    A. J. Allen (Physicists), L. E. Levine (Physicists) & G. G. Long (Physicist)

  4. X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL, 60439, USA

    J. Ilavsky (Physicist) & G. G. Long (Physicist)

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  1. F. Zhang
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Correspondence to J. Ilavsky.

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Manuscript submitted February 13, 2011.

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Zhang, F., Allen, A.J., Levine, L.E. et al. Ultra-Small-Angle X-ray Scattering—X-ray Photon Correlation Spectroscopy: A New Measurement Technique for In-Situ Studies of Equilibrium and Nonequilibrium Dynamics. Metall Mater Trans A 43, 1445–1453 (2012). https://doi.org/10.1007/s11661-011-0790-0

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