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Study of γ/γ′ Interfaces in Nickel-Based, Single-Crystal Superalloys by Scanning Transmission Electron Microscopy

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Abstract

The interfaces of γ/γ′ in crept Re-bearing, single-crystal, nickel-based superalloys have been studied by scanning transmission electron microscopy. Elements Ni and Ta are congregated at the γ′ side, ahead of the Re enrichment near interfaces, which shows the retarding effect on element diffusion during creep by Re enrichment. A growth step exists at the γ/γ′ interfaces with the apex of kinks congregated with heavy atoms, which may slow down interface displacement during creep.

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This work is supported financially by National 973 Project of China and Chinese National Nature Science Foundation. This work used resources of the Beijing National Center for Electron Microscopy.

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Author notes

  1. Binghui Ge (Assistant Researcher)

    Present address: Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, P.R. China

Authors and Affiliations

  1. Beijing National Center for Electron Microscopy, Tsinghua University, Beijing, 100084, P.R. China

    Binghui Ge (Assistant Researcher)

  2. National Key Laboratory of Science and Technology on Advanced High Temperature Structural Materials, Beijing Institute of Aeronautical Materials, Beijing, 100095, P.R. China

    Yushi Luo (Senior Engineer) & Jiarong Li (Researcher)

  3. Department of Materials Science and Engineering, Laboratory of Advanced Materials, Beijing National Center for Electron Microscopy, Tsinghua University, Beijing, P.R. China

    Jing Zhu (Professor)

Authors
  1. Binghui Ge
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  2. Yushi Luo
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  3. Jiarong Li
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  4. Jing Zhu
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Corresponding author

Correspondence to Jing Zhu.

Additional information

Manuscript submitted October 17, 2010.

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Ge, B., Luo, Y., Li, J. et al. Study of γ/γ′ Interfaces in Nickel-Based, Single-Crystal Superalloys by Scanning Transmission Electron Microscopy. Metall Mater Trans A 42, 548–552 (2011). https://doi.org/10.1007/s11661-010-0566-y

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  • DOI: https://doi.org/10.1007/s11661-010-0566-y

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