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Microstructural Characterization of Nanosized Ceria Powders by X-Ray Diffraction Analysis

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Abstract

Spherically shaped nanocrystalline ceria powders were prepared by high energy ball milling (HEBM) of plate-shaped as-received ceria powders. Rietveld analysis was used to determine the surface weighted average crystallite size, lattice parameter, and lattice strain. The classical Williamson–Hall as well as modified Williamson–Hall method was used to determine the volume weighted average crystallite size. A comparison of the crystallite size obtained by the classical as well as modified Williamson–Hall method shows that the strain anisotropy consideration in the modified Williamson–Hall method yields a lower value of the crystallite size, and this difference becomes more pronounced with the increase in milling time. The modified Williamson–Hall method indicates that the dislocations present in the ceria powders are edge in character. The ceria powders also were characterized by field emission scanning electron microscopy (FESEM) and high resolution transmission electron microscopy (HRTEM) techniques.

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  1. JEOL is a trademark of Japan Electron Optics Ltd., Tokyo.

  2. ZETATRAC is a trademark of Microtrac Inc, Montgomeryville, PA.

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Acknowledgment

Financial support received from the Indian Rare Earths Ltd. Research Centre to carry out a part of this research is gratefully acknowledged.

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Authors and Affiliations

  1. Department of Metallurgical and Materials Engineering, Indian Institute of Technology, Kharagpur, 721302, India

    Ranjan Sen (Research Scholar), Siddhartha Das (Professor) & Karabi Das (Professor)

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  1. Ranjan Sen
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  2. Siddhartha Das
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  3. Karabi Das
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Correspondence to Karabi Das.

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Manuscript submitted April 13, 2010.

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Sen, R., Das, S. & Das, K. Microstructural Characterization of Nanosized Ceria Powders by X-Ray Diffraction Analysis. Metall Mater Trans A 42, 1409–1417 (2011). https://doi.org/10.1007/s11661-010-0463-4

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