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Defect-Related Physical-Profile-Based X-Ray and Neutron Line Profile Analysis

  • Symposium: Neutron and X-Ray Studies of Advanced Materials
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Abstract

Diffraction line broadening is caused by different defects present in crystalline materials: (1) small coherent domains, (2) dislocations, (3) other types of microstrains, (4) twin boundaries, (5) stacking faults, (6) chemical inhomogeneities, and (7) grain-to-grain second-order internal stresses. Line profile analysis provides qualitative and quantitative information about defect types and densities, respectively. Line profiles can broaden, be asymmetric, and be shifted, and these features can be anisotropic in terms of hkl indices. A few thumb rules help qualitative selection of lattice defect types. If the breadths do not increase globally with hkl, the defects are of size type, i.e., either the domain size is small or twinning or faulting, or both, is present. Whenever the breadths increase globally, the defects produce microstrains. Physically based profile functions can be determined for the different defect types and hkl anisotropy. The qualitative input about defect types based on different experimental observations allows adequate quantitative evaluation of the densities of different defect types by using physically modeled profile functions.

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Acknowledgments

The authors are grateful to the Hungarian National Science Foundation OTKA Grant Nos. 71594 and 67692 for the support of this work.

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Authors and Affiliations

  1. Department of Materials Physics, Eötvös University Budapest, H-1518, POB 32, Budapest, Hungary

    Tamás Ungár (Full Professor), Levente Balogh (Postdoctoral Student) & Gábor Ribárik (Postdoctoral Research Assistant)

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  1. Tamás Ungár
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  2. Levente Balogh
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  3. Gábor Ribárik
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Correspondence to Tamás Ungár.

Additional information

This article is based on a presentation given in the symposium “Neutron and X-Ray Studies of Advanced Materials,” which occurred February 15–19, 2009, during the TMS Annual Meeting in San Francisco, CA, under the auspices of TMS, TMS Structural Materials Division, TMS/ASM Mechanical Behavior of Materials Committee, TMS: Advanced Characterization, Testing, and Simulation Committee, and TMS: Titanium Committee.

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Ungár, T., Balogh, L. & Ribárik, G. Defect-Related Physical-Profile-Based X-Ray and Neutron Line Profile Analysis. Metall Mater Trans A 41, 1202–1209 (2010). https://doi.org/10.1007/s11661-009-9961-7

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