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He, L.M., Meyer, J.D., Lee, W.Y. et al. Depth profiling of Hf-doped aluminide coating by glow-discharge mass spectrometry. Metall Mater Trans A 33, 3578–3582 (2002). https://doi.org/10.1007/s11661-002-0348-2
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DOI: https://doi.org/10.1007/s11661-002-0348-2