Abstract
AFM (atomic force microscopy) technology was applied on C-S-H (calcium silicate hydrate phase) microstructure investigation. The topographies of hydrated C3S (Tricalcium silicate) samples were firstly acquired with AFM. Accordingly, C-S-H can be identified according its pattern. Then the hydrated pssortland cement samples at different curing time were scanned with AFM. The topographies and force displacement curve were acquired and its characters at different days were summarized and analyzed. These results are very meaningful for C-S-H microstructure further investigation and cement-base material macro scale properties improvement.
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Funded by the “973” Project (No. 2009CB623200) and the National Natural Science Foundation of China (50972109)
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Zhang, B., He, Z. & Sun, H. C-S-H cluster microstructure and bonding force investigation base on AFM technology. J. Wuhan Univ. Technol.-Mat. Sci. Edit. 25, 592–595 (2010). https://doi.org/10.1007/s11595-010-0050-y
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DOI: https://doi.org/10.1007/s11595-010-0050-y