Abstract
The annealing-time dependence of the electrical conductivity of multilayered single-crystal and polycrystalline metal films has been analyzed theoretically within the frame of the semi-classical approach. It is demonstrated that changes in the electrical conductivity which are caused by the diffusion annealing allow for investigating the processes of the bulk and grain-boundary diffusion, and for estimating the coefficients of the diffusion. The electrical conductivity was calculated and the numerical analysis of the diffusion-annealing time dependence was performed at various parameters.
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Dekhtyaruk, L.V. Influence of interdiffusion on the electrical conductivity of multilayered metal films. centr.eur.j.phys. 4, 73–86 (2006). https://doi.org/10.1007/s11534-005-0007-5
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DOI: https://doi.org/10.1007/s11534-005-0007-5