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Clustering patents using non-exhaustive overlaps

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Abstract

Patent documents are unique external sources of information that reveal the core technology underlying new inventions. Patents also serve as a strategic data source that can be mined to discover state-of-the-art technical development and subsequently help guide R&D investments. This research incorporates an ontology schema to extract and represent patent concepts. A clustering algorithm with non-exhaustive overlaps is proposed to overcome deficiencies with exhaustive clustering methods used in patent mining and technology discovery. The non-exhaustive clustering approach allows for the clustering of patent documents with overlapping technical findings and claims, a feature that enables the grouping of patents that define related key innovations. Legal advisors can use this approach to study potential cases of patent infringement or devise strategies to avoid litigation. The case study demonstrates the use of non-exhaustive overlaps algorithm by clustering US and Japan radio frequency identification (RFID) patents and by analyzing the legal implications of automated discovery of patent infringement.

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Authors and Affiliations

  1. Department of Management Science, National Chiao Tung University, Taiwan, China

    Charles V. Trappey

  2. Department of Industrial Engineering & Management, National Taipei University of Technology, Taiwan, China

    Amy J.C. Trappey

  3. Department of Industrial Engineering & Engineering Management, National Tsing Hua University, Taiwan, China

    Amy J.C. Trappey & Chun-Yi Wu

Authors
  1. Charles V. Trappey
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  2. Amy J.C. Trappey
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  3. Chun-Yi Wu
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Corresponding author

Correspondence to Amy J.C. Trappey.

Additional information

Charles Trappey is a professor of marketing in the Department of Management Science at the National Chiao Tung University.

Amy J.C. Trappey is chair professor in the Department of Industrial Engineering and Management and Dean, College of Management at the National Taipei University of Technology. She is also a faculty member of the Department of Industrial Engineering and Engineering Management, the National Tsing Hua University. Dr. Trappey is an ASME Fellow.

Chun-Yi Wu is a doctoral student in the Department of Industrial Engineering and Engineering Management at National Tsing Hua University and a system analyst and engineer at Avectec, Inc. His research interests include the development of computerized intelligent systems and the knowledge management of patents and intellectual properties.

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Trappey, C.V., Trappey, A.J. & Wu, CY. Clustering patents using non-exhaustive overlaps. J. Syst. Sci. Syst. Eng. 19, 162–181 (2010). https://doi.org/10.1007/s11518-010-5134-x

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  • DOI: https://doi.org/10.1007/s11518-010-5134-x

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