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Theoretical Analysis of Multilayer Surface Plasmon Resonance Sensors Using Thin-Film Optical Admittance Formalism

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Abstract

A theoretical analysis of surface plasmon resonance (SPR) behavior of conventional Ag sensor within the Kretschmann configuration is reported using thin-film optical admittance formalism. We examine the additional layer thickness and refractive index effects on optical admittance by considering Ag/SiO2, Ag/TiO2, and Ag/Si sensors. Theoretical results show that imaginary part of admittance is more sensitive to the sensing medium refractive index change than its real part, and a maximum of angular sensitivity reached by the sensors may be obtained simply by calculating the shift of the incident angle corresponding to the minimum of admittance imaginary parts.

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Authors and Affiliations

  1. Laboratoire d’Étude des Matériaux et Instrumentations Optiques, University Djillali Liabes, Physics Department, Sidi Bel Abbes, 22000, Algeria

    M. Chikhi & F. Benkabou

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  1. M. Chikhi
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  2. F. Benkabou
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Correspondence to M. Chikhi.

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Chikhi, M., Benkabou, F. Theoretical Analysis of Multilayer Surface Plasmon Resonance Sensors Using Thin-Film Optical Admittance Formalism. Plasmonics 10, 1467–1472 (2015). https://doi.org/10.1007/s11468-015-9945-y

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  • DOI: https://doi.org/10.1007/s11468-015-9945-y

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