The input pattern problem on deep learning applied to signal analysis and processing to achieve fault diagnosis

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Acknowledgements

This work was supported by National Natural Science Foundation of China (Grant Nos. 61633005, 61673076, 61773080), Natural Science Foundation of Chongqing, China (Grant No. cstc2016jcyjA0504), Fundamental Research Funds for the Central Universities (Grant Nos. 106112016CDJXZ238826, 2018CDYJSY0055), and Natural Science Research Project of the Higher Education Institutions of Jiangsu Province (Grant No. 18KJB510006).

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Correspondence to Nan Li.

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Ren, H., Li, N., Chai, Y. et al. The input pattern problem on deep learning applied to signal analysis and processing to achieve fault diagnosis. Sci. China Inf. Sci. 62, 229202 (2019). https://doi.org/10.1007/s11432-018-9564-6

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