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The input pattern problem on deep learning applied to signal analysis and processing to achieve fault diagnosis

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Acknowledgements

This work was supported by National Natural Science Foundation of China (Grant Nos. 61633005, 61673076, 61773080), Natural Science Foundation of Chongqing, China (Grant No. cstc2016jcyjA0504), Fundamental Research Funds for the Central Universities (Grant Nos. 106112016CDJXZ238826, 2018CDYJSY0055), and Natural Science Research Project of the Higher Education Institutions of Jiangsu Province (Grant No. 18KJB510006).

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Authors and Affiliations

  1. School of Automation, Chongqing University, Chongqing, 400044, China

    Hao Ren, Nan Li, Yi Chai, Jianfeng Qu & Qiu Tang

  2. Key Laboratory of Complex System Safety and Control, Ministry of Education, Chongqing, 400044, China

    Hao Ren, Nan Li, Yi Chai, Jianfeng Qu & Qiu Tang

  3. School of Computer Science and Technology, Huaiyin Normal University, Huaian, 223300, China

    Lei Huang

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  1. Hao Ren
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  2. Nan Li
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  3. Yi Chai
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  4. Jianfeng Qu
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  5. Qiu Tang
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  6. Lei Huang
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Corresponding author

Correspondence to Nan Li.

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Ren, H., Li, N., Chai, Y. et al. The input pattern problem on deep learning applied to signal analysis and processing to achieve fault diagnosis. Sci. China Inf. Sci. 62, 229202 (2019). https://doi.org/10.1007/s11432-018-9564-6

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  • DOI: https://doi.org/10.1007/s11432-018-9564-6

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