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Defect characterization of amorphous silicon thin film solar cell based on low frequency noise

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Acknowledgements

This work was supported by National Natural Science Foundation of China (Grant No. 61106062), Fundamental Research Funds for the Central Universities (Grant No. JB181409), and Ankang College Youth Fund (Grant No. 2017AYQN06).

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Correspondence to Liang He.

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Hu, L., He, L., Chen, H. et al. Defect characterization of amorphous silicon thin film solar cell based on low frequency noise. Sci. China Inf. Sci. 61, 069403 (2018). https://doi.org/10.1007/s11432-017-9360-7

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