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Comparison of single-event upset generated by heavy ion and pulsed laser

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Single-event upset (SEU) is investigated using heavy ion and pulsed laser. The measured SEU cross sections of D and DICE flip-flops are compared. Measurement results indicate pulsed laser is capable of inducing similar SEU to those induced by heavy ion. 3D-TCAD simulation is performed to investigate the factors to impact pulsed laser induced SEU. Simulation results show that the beam spot size significantly impacts SEU cross sections in both low and high laser energy while the variation of the equivalent LET only impacts SEU cross sections in the low laser energy.

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This work was supported by National Natural Science Foundation of China (Grant Nos. 61376109, 61434007). The authors would like to thank the HI-13 teams, the HIRFL teams and the SEEL teams for heavy ion and pulsed laser experiment supports.

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Correspondence to Bin Liang.

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Liang, B., Song, R., Han, J. et al. Comparison of single-event upset generated by heavy ion and pulsed laser. Sci. China Inf. Sci. 60, 072401 (2017). https://doi.org/10.1007/s11432-016-0346-1

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  • single-event upset
  • charge sharing
  • cross sections
  • heavy ion
  • pulsed laser