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A snake addressing scheme for phase change memory testing

面向相变存储器测试的蛇形寻址方法

Abstract

Phase change memory (PCM) is one of the most promising candidates for next generation nonvolatile memory. However, PCM suffers from a variety of faults due to its special device structure and operation mechanism. A snake addressing scheme is introduced into the test algorithms of PCM to reduce the test time and excite proximity disturb faults more effectively. The March test algorithm with the proposed snake addressing scheme is less complex than most traditional test algorithms. In addition to conventional faults, it is capable of covering disturb and parasitic faults. Moreover, when incorporated with the sneak path testing method, it is able to test the read fault, read recovery fault, incomplete program fault 0, and false write fault.

摘要

中文概要

相变存储器是一种新型非易失存储器。由于其特殊的器件特性和操作机制, 相变存储器可能发生多种类型的故障。本文设计了一种面向相变存储器测试的蛇形寻址方法, 可更加有效地激活相变存储器中的热串扰故障, 并利于减少测试时间。引入蛇形寻址方法的March测试算法, 可有效覆盖十种相变存储器故障类型, 且可将测试复杂度降低至7mn。引入蛇形寻址方法的潜通路测试算法可进而将测试复杂度降低至4.95mn, 并仍可覆盖十种相变存储器故障类型。

创新点

  1. 1、

    设计了一种面向相变存储器测试的蛇形寻址方法, 可更加有效的激活相变存储器的热串扰故障。

  2. 2、

    应用蛇形寻址方法, 设计了一种相变存储器阵列的March测试算法, 可有效覆盖十种相变存储器故障, 并将算法复杂度降至7mn。

  3. 3、

    应用蛇形寻址方法, 设计了一种相变存储器阵列的潜通路测试算法, 用4.95mn的算法复杂度代价有效覆盖十种相变存储器故障。

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Correspondence to Xiaole Cui.

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Cui, X., Cheng, Z., Lee, C. et al. A snake addressing scheme for phase change memory testing. Sci. China Inf. Sci. 59, 102401 (2016). https://doi.org/10.1007/s11432-015-5437-0

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Keywords

  • phase change memory
  • fault model
  • snake addressing mode
  • March test algorithm
  • sneak path test method

关键词

  • 相变存储器
  • 故障模型
  • 蛇形寻址方式
  • March 测试算法
  • 潜通路测试方法