Abstract
Internal SET has become a great concern in normal radiation-hardened flip-flops with increases in frequency. We investigate the internal SET problem in the traditional hardened flip-flops in this article. We also propose a novel structure to eliminate the internal SET problem. Three-dimensional technology computer-aided design (TCAD) was adopted to verify the hardened performance of this proposed novel structure. Besides, the power and setup time were compared with the traditional hardened flip-flops.
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Liang, B., Song, R. Analyzing and mitigating the internal single-event transient in radiation hardened flip-flops at circuit-level. Sci. China Technol. Sci. 57, 1834–1839 (2014). https://doi.org/10.1007/s11431-014-5595-0
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DOI: https://doi.org/10.1007/s11431-014-5595-0