Abstract
Background
Heterodyne interferometry offers an exciting solution for achieving sub-nanometer or ten-picometer-order mechanical displacement measurements because of its high resolution and noise immunity.
Objective
In this paper, we investigate the stability and resolution of a conventional displacement-measuring heterodyne interferometer using a single phase-locked loop (PLL) at a sub-nanometer or 10-pm level over an µm-scale measurement regime in normal air.
Methods
In the experiment, we perform the beat frequency reduction of the heterodyne signals to take advantage of a low-cost frequency sampling data acquisition (DAQ). The primary calculations of the single phase-locked loop (PLL) algorithm are implemented in a point-by-point (pt-pt) construction, providing pt–pt low-pass filters (LPFs) with high noise suppression. The output is appended into an array of N points and averaged to reduce the noise of the outgoing signal again. Using the PLL phase meter with the beat frequency reduction can ensure a mdeg-order phase measurement with Allan deviation stability of ~ 10 µdeg over 1000 s. We consider a combination of the miniaturization of optical paths in air and the PLL phase meter integrated with low-cost devices while ensuring mdeg-order measurement stability to achieve the interferometer's pm-order measurement resolution and stability.
Results
The measurement results show that the interferometer can achieve a resolution of 26 pm over a 5 μm-range mechanical displacement measurement. The Allan deviation stability of the interferometer reaches ~ 10 pm over a sampling time of 30 s, and the displacement noise floor is 10 pm/Hz1/2 above 1 Hz.
Conclusions
The new signal-processing PLL phase meter provides higher noise reduction than the old one presented in our previous work. With low cost but high resolution and stability, the PLL phase meter is incredibly suitable for pm-order displacement-measuring heterodyne interferometry. Combining a well-reduced PLL phase meter and a conventional heterodyne interferometer with a stable, isolated configuration and the minimization of optical paths in the air can give the measurement system a high resolution and stability. The measurement system can have a more significantly improved resolution of a few tens of pm than interferometers presented in previous publications and stability comparable to the modified heterodyne interferometers shown in earlier works over the sampling time of 30 s (possibly up to 100 s). A conventional heterodyne interferometer with a single PLL is expected to perform large-range displacement measurements with resolution at ten picometer levels in air.
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References
Gatzen HH, Saile V, Leuthold J (2015) Micro and nano fabrication. Verlag Berlin Heidelberg, Tools and processes), Springer
Schmidt R-HM (2012) Ultra-precision engineering in lithographic exposure equipment for the semiconductor industry. Phil Trans R Soc A 370:3950–3972
Schneider F, Das J, Kirsch B, Linke B, Aurich JC (2019) Sustainability in ultra-precision and micromachining: A review. Int J Precis Eng Manuf Green Tech 6601–610
Gao W, Haitjema H, Fang FZ, Leach RK, Cheung CF, Savio E, Linares JM (2019) On-machine and in-process surface metrology for precision manufacturing. CIRP Ann 68:843–866
Yoon J-S, Baek R-H (2020) Device Design Guideline of 5-nm-Node FinFETs and Nanosheet FETs for Analog/RF Applications. IEEE Access 8:89395–189403
Camenzind TN, Elsayed A, Mohiyaddin FA, Li R, Kubicek S, Jussot J, Dorpe PV, Govoreanu B, Radu I, Zumbühl DM (2021) High mobility SiMOSFETs fabricated in a full 300mm CMOS process. Mater Quantum Technol 1:041001
Shi WH, Lv WM, Sun TY, Zhang BS (2019) Optoelectronic platform and technology. Front Inf Technol Electronic Eng 20:439–457
IRDS Systems and Architectures Team (2020) International Roadmap for Devices and Systems: Executive Summary. IEEE Adv Technol Human 63. https://irds.ieee.org/images/files/pdf/2020/2020IRDS_ES.pdf
Cao QK, Xie HM (2018) Application of Moiré interferometry to the characterization of orthotropic materials in the antisymmetric configuration using the virtual fields method. Exp Mech 58:783–798
Nathamgari SSP, Dong S, Hosseinian E, Lauhon LJ, Espinosa HD (2019) An experimental setup for combined in-vacuo Raman spectroscopy and cavity-interferometry measurements on TMDC nano-resonators. Exp Mech 59:349–359
Luiz JO, Viotti MR, Albertazzi A (2022) Residual stress characterization in cross-sections of small parts by combining the contour method and scanning white-light interferometry. Exp Mech 62:1333–1348
Gao SW, Kim H, Bosse H, Haitjema YL, Chen XD, Lu W, Knapp A, Weckenmann WT, Estler H (2015) Kunzmann, Measurement technologies for precision positioning. CIRP Ann 64:773–796
Onur YA (2016) Experimental and theoretical investigation of prestressing steel strand subjected to tensile load. Int J Mech Sci 118:91–100
Hori Y, Gonda S, Bitou Y, Watanabe A, Nakamura K (2018) Periodic error evaluation system for linear encoders using a homodyne laser interferometer with 10 picometer uncertainty. Precis Eng 51:388–392
Badami VG, Groot PJD (2013) Displacement measuring interferometry, in Handbook of optical dimensional metrology. A Taylor and Francis book: US pp 157–236
Hao H, Lin H, Chen J, Xia W, Guo D, Wang M (2021) Enhanced laser self-mixing interferometry based on tunable Fabry-Perot Filter. Opt Laser Technol 135:106666
Alonso-Murias M, Monzón-Hernández D, Antonio-Lopez E, Schülzgen A, Amezcua-Correa R, Villatoro J (2022) Hybrid optical fiber Fabry-Perot interferometer for nano-displacement sensing. Opt Laser Technol 155:108426
Pisani M (2009) A homodyne Michelson interferometer with sub-picometer resolution. Meas Sci Technol 20:084008
Farrar CR, Darling TW, Migliori A, Baker WE (1999) Microwave interferometers for non-contact vibration measurements on large structures. Mech Syst Signal Process 13:241–253
Vu TT, Higuchi M, Aketagawa M (2016) Accurate displacement-measuring interferometer with wide range using an I2 frequency-stabilized laser diode based on sinusoidal frequency modulation. Meas Sci Technol 27:105201
Duong QA, Vu TT, Higuchi M, Wei D, Aketagawa M (2018) Iodine-frequency-stabilized laser diode and displacement-measuring interferometer based on sinusoidal phase modulation Meas. Sci Technol 29:065204
Nguyen T-D, Duong Q-A, Higuchi M, Vu T-T, Wei D, Aketagawa M (2020) 19-picometer mechanical step displacement measurement using heterodyne interferometer with phase-locked loop and piezoelectric driving flexure-stage. Actuators A Phys 304:111880
Nguyen T-D, Higuchi M, Vu T-T, Wei D, Aketagawa M (2020) 10-pm-order mechanical displacement measurements using heterodyne interferometry. Appl Optic 59:8478–8485
Nanami M, Kobayashi I, Miyagi K, Taniguchi A (1995) High resolution optical heterodyne interferometry using a two-frequency light module. Opt Laser Technol 27:xii
Armano M, Audley H, Baird J, Binetruy P, Born M, Bortoluzzi D, Brandt N, Castelli E, Cavalleri A, Cesarini A, Cruise AM et al (2021) Sensor noise in LISA Pathfinder: In-flight performance of the optical test mass readout. Phys Rev Lett 126:131103
Ming M, Luo Y, Liang Y-R, Zhang J-Y, Duan H-Z, Yan H, Jiang Y-Z, Lu L-F, Xiao Q, Zhou Z, Yeh H-C (2020) Ultraprecision intersatellite laser interferometry. Int J Extrem Manuf 2:022003
Rahm S, Loth C, Dabas A, Elouragini S (1994) Improvement of heterodyne detection with optical amplifier and pulsed coherent Doppler, Lidar. J Mod Opt 41:2145–2151
Wu CM (2004) Heterodyne interferometric system with subnanometer accuracy for measurement of straightness. Appl Opt 43:3812–3816
Lee JY, Chen HY, Hsu CC, Wu CC (2007) Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution. Sens Actuator A Phys 13:185–191
Chandrahalim H, Bhave SA, Polcawich RG, Pulskamp J, Pourat B, Boedecker S, Rembe C (2009) Heterodyne laser-Doppler interferometric characterization of contour-mode resonators above 1 GHz. IEEE Int Ultrason Symp 1044–1049
Leonhardt V, Camp JB (2006) Space interferometry application of laser frequency stabilization with molecular iodine. Appl Opt 45:4142–4146
National Instruments, Digitizer adapter module for FlexRIO. https://www.ni.com/en-au/shop/hardware/products/digitizer-adapter-module-for-flexrio.html. Accessed 1 Apr 2023
Entegra, XA-160M dual 160 MSPS 16 bit ADC, dual 615 MSPS 16 bit DAC. https://www.entegra.co.uk/ii-products/xa-160m/. Accessed 1 Apr 2023
Birch KP, Downs MJ (1993) An updated Edlén equation for the refractive index of air. Metrologia 30:155–162
Bönsch G, Potulski E (1998) Measurement of the refractive index of air and comparison with modified Edlén’s formulae. Metrologia 35:133–139
Ciddor PE (1996) Refractive index of air: new equations for the visible and near infrared. Appl Opt 35:1566–1573
Jang Y-S, Kim S-W (2017) Compensation of the refractive index of air in laser interferometer for distance measurement: A review. Int J Precis Eng Manuf 18:1881–1890
Yin Y, Liu Z, Jiang S, Wang W, Yu H, Li W, Jiri G (2021) Grating-based 2D displacement measurement with quadruple optical subdivision of a single incident beam. Opt Exp 29:24169–24181
Yin Y, Liu Z, Jiang S, Wang W, Yu H, Jiri G, Hao Q, Li W (2022) High-precision 2D grating displacement measurement system based on double-spatial heterodyne optical path interleaving. Opt Lasers Eng 158:107167
Zhu J, Wang G, Wang S, Li X (2022) A reflective-type heterodyne grating interferometer for three-degree-of-freedom subnanometer measurement. IEEE Trans Instrum Meas 71:1–9
Xu X, Dai Z, Tan Y (2022) A dual-beam differential method based on feedback interferometry for noncontact measurement of linear and angular displacement. IEEE Trans Ind Electron 1–10
Joo K-N, Clark E, Zhang Y, Ellis JD, Guzmán F (2020) A compact high-precision periodic-error-free heterodyne interferometer. J Opt Soc Am A 37:B11–B18
Zhang Y, Guzman F (2022) Quasi-monolithic heterodyne laser interferometer for inertial sensing. Opt Lett 47:5120–5123
NF Corporation, Lock-in Amplifier Frequency Extender 5571. https://www.nfcorp.co.jp/pro/mi/lb/lockin/5571/. Accessed 1 Apr 2023
Keysight, Agilent 10897B High Resolution Laser Axis Board. https://www.keysight.com/us/en/product/10897B/highresolution-vmebus-laser-axis-board.html. Accessed 1 Apr 2023
Tanaka M, Yamagami T, Nakayama K (1989) Linear interpolation of periodic error in a heterodyne laser interferometer at sub-nanometer levels. IEEE Trans Instrum Meas 38:552–554
Funding
This research is funded by Hanoi University of Science and Technology (HUST) under project number T2022-TT-003.
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Nguyen, T.D., Dinh, G.N. Stability and Resolution of a Conventional Displacement Measuring Heterodyne Interferometer Using a Single Phase-Locked Loop. Exp Mech 63, 1015–1032 (2023). https://doi.org/10.1007/s11340-023-00970-x
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DOI: https://doi.org/10.1007/s11340-023-00970-x