Abstract
Continued advances in microelectromechanical systems (MEMS) technology have led to development of a multitude of new sensors and their corresponding advanced applications. Great many of these sensors (e.g., microgyroscopes, accelerometers, biological, chemical, security, medical, etc.) rely on either sensing elements or elastic suspensions that resonate. Regardless of their applications, sensors are always designed to provide the most exact responses to the signals they are developed to detect and/or monitor. One way to quantify this exactness is to use the Quality factor (Q-factor). MEMS sensors are typically fabricated out of materials that are mechanically sound at the microscale, but can be relatively poor electrical conductors. For this reason, areas of MEMS are coated with various thin metal films to provide electrical pathways. These films, however, adversely alter resonant properties of a device. To facilitate our study, microcantilever configurations were selected to test influence that thin metal films have on resonators. This paper reviews a theoretical analysis of the effect that thermoelastic internal friction has on the Q-factor of microscale resonators and shows that the internal friction relating to TED is a fundamental damping mechanism in determination of quality of high-Q resonators over a range of operating conditions. Using silicon microcantilevers coated with aluminum films from 5 nm to 30 nm thick, on one as well as both sides, Q-factors were experimentally determined using the ring-down method. From the ring-down curve, the Q-factor of each microcantilever was determined. Experimental results show that as thickness of the aluminum film increases, Q-factor of the device decreases. Comparison of analytical and experimental results indicates good correlation, well within the limits based on uncertainty analysis. In addition, preliminary results also show a significant temperature dependence of the Q-factor of aluminum coated microcantilevers.
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This study was supported by the NEST program at WPI-ME/CHSLT. The author gratefully acknowledges permissions by sponsors to present results of their projects and thanks for contributions to the developments presented in this paper by the members of the CHSLT.
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Pryputniewicz, R.J. Effect of Thin Films on Dynamic Performance of Resonating MEMS. Exp Mech 54, 25–33 (2014). https://doi.org/10.1007/s11340-013-9809-3
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DOI: https://doi.org/10.1007/s11340-013-9809-3