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Diagnostic Classification Models for Testlets: Methods and Theory

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Abstract

Diagnostic classification models (DCMs) have seen wide applications in educational and psychological measurement, especially in formative assessment. DCMs in the presence of testlets have been studied in recent literature. A key ingredient in the statistical modeling and analysis of testlet-based DCMs is the superposition of two latent structures, the attribute profile and the testlet effect. This paper extends the standard testlet DINA (T-DINA) model to accommodate the potential correlation between the two latent structures. Model identifiability is studied and a set of sufficient conditions are proposed. As a byproduct, the identifiability of the standard T-DINA is also established. The proposed model is applied to a dataset from the 2015 Programme for International Student Assessment. Comparisons are made with DINA and T-DINA, showing that there is substantial improvement in terms of the goodness of fit. Simulations are conducted to assess the performance of the new method under various settings.

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Funding

This project is supported in part by the National Science Foundation (DMS-2015417), China Postdoctoral Science Foundation (2021M700466), and the China National Natural Science Foundation (12301376, 12371263).

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Correspondence to Susu Zhang.

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This project is supported in part by the National Science Foundation (DMS-2015417), China Postdoctoral Science Foundation (2021M700466), and the China National Natural Science Foundation (12301376, 12371263). The authors have no competing interests to declare that are relevant to the content of this article. The datasets analyzed during the current study are publicly available in the PISA 2015 Database.

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Xu, X., Fang, G., Guo, J. et al. Diagnostic Classification Models for Testlets: Methods and Theory. Psychometrika (2024). https://doi.org/10.1007/s11336-024-09962-9

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