Measurement campaigns have been conducted in order to characterize the RFID propagation channel. A number of propagation scenarios have been exploited, including both outdoor and indoor environments in typical manufacturing plants. Field data are then analyzed and a path loss model is proposed. Such a model is based on an improvement of the classical two-ray path loss mechanism, additionally adjusted to encompass the effects of the inherently directional propagation properties of the RFID environment. The fading effect has also been characterized, and it has been observed that the Extreme Value Distribution may yield a good fitting to the experimental data. To the best of the authors’s knowledge, the scope and reach of the experiment as well as the proposed model are unprecedented in the literature.
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Part of this work was presented at 2012 IEEE PIMRC .
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This work was partially sponsored by CNPq, Grant Nos. 312.146/2012-4 and 304.248/2014-2, and by Finep (with Funttel resources), Grant 01.14.0231.00, under the Radiocommunications Reference Center (Centro de Referência em Radiocomunicações—CRR). The authors would like to thank CAPES and CNPq for their financial support, and UNICAMP and the companies that made available their premises for the measurements.
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Goes, A.A., Cardieri, P. & Yacoub, M.D. The RFID Propagation Scenario. Wireless Pers Commun 92, 437–454 (2017). https://doi.org/10.1007/s11277-016-3550-z
- Propagation model
- Backscattering and short-term fading