A Practical Approach to 3D Scanning in the Presence of Interreflections, Subsurface Scattering and Defocus

  • Mohit GuptaEmail author
  • Amit Agrawal
  • Ashok Veeraraghavan
  • Srinivasa G. Narasimhan


Global or indirect illumination effects such as interreflections and subsurface scattering severely degrade the performance of structured light-based 3D scanning. In this paper, we analyze the errors in structured light, caused by both long-range (interreflections) and short-range (subsurface scattering) indirect illumination. The errors depend on the frequency of the projected patterns, and the nature of indirect illumination. In particular, we show that long-range effects cause decoding errors for low-frequency patterns, whereas short-range effects affect high-frequency patterns.

Based on this analysis, we present a practical 3D scanning system which works in the presence of a broad range of indirect illumination. First, we design binary structured light patterns that are resilient to individual indirect illumination effects using simple logical operations and tools from combinatorial mathematics. Scenes exhibiting multiple phenomena are handled by combining results from a small ensemble of such patterns. This combination also allows detecting any residual errors that are corrected by acquiring a few additional images. Our methods can be readily incorporated into existing scanning systems without significant overhead in terms of capture time or hardware. We show results for several scenes with complex shape and material properties.


Structured light 3D scanning Interreflections Subsurface scattering Defocus Global illumination Indirect illumination Light transport Projectors 



We thank Jay Thornton, Joseph Katz, John Barnwell and Haruhisa Okuda (Mitsubishi Electric Japan) for their help and support. Mohit Gupta was partially supported by ONR grant N00014-11-1-0295. Srinivasa Narasimhan was partially supported by NSF grants IIS-0964562 and CAREER IIS-0643628 and a Samsung SAIT GRO grant. Ashok Veeraraghavan was partially supported by NSF Grants IIS-1116718 and CCF-1117939. The authors thank Vincent Chapdelaine-Couture for sharing their data-sets.


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Copyright information

© Springer Science+Business Media, LLC 2012

Authors and Affiliations

  • Mohit Gupta
    • 1
    Email author
  • Amit Agrawal
    • 2
  • Ashok Veeraraghavan
    • 3
  • Srinivasa G. Narasimhan
    • 4
  1. 1.Computer Science DepartmentColumbia UniversityNew YorkUSA
  2. 2.Mitsubishi Electrical Research LabsCambridgeUSA
  3. 3.Electrical and Computer Engineering DepartmentRice UniversityHoustonUSA
  4. 4.Robotics InstituteCarnegie Mellon UniversityPittsburghUSA

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