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Software Quality Journal

, Volume 15, Issue 3, pp 327–344 | Cite as

Software quality estimation with limited fault data: a semi-supervised learning perspective

  • Naeem SeliyaEmail author
  • Taghi M. Khoshgoftaar
Article

Abstract

We addresses the important problem of software quality analysis when there is limited software fault or fault-proneness data. A software quality model is typically trained using software measurement and fault data obtained from a previous release or similar project. Such an approach assumes that fault data is available for all the training modules. Various issues in software development may limit the availability of fault-proneness data for all the training modules. Consequently, the available labeled training dataset is such that the trained software quality model may not provide predictions. More specifically, the small set of modules with known fault-proneness labels is not sufficient for capturing the software quality trends of the project. We investigate semi-supervised learning with the Expectation Maximization (EM) algorithm for software quality estimation with limited fault-proneness data. The hypothesis is that knowledge stored in software attributes of the unlabeled program modules will aid in improving software quality estimation. Software data collected from a large NASA software project is used during the semi-supervised learning process. The software quality model is evaluated with multiple test datasets collected from other NASA software projects. Compared to software quality models trained only with the available set of labeled program modules, the EM-based semi-supervised learning scheme improves generalization performance of the software quality models.

Keywords

Semi-supervised learning Software quality estimation Unlabeled data Software metrics Expectation maximization 

Notes

Acknowledgements

We thank the anonymous reviewers for their comments and suggestions, which went toward improving this paper. We are grateful to Liam Mayron, Lili Zhao and Renee Zuleta for their assistance with editorial reviews. We thank the staff of the NASA Metrics Data Program for making the software measurement data available.

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Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  1. 1.Computer and Information ScienceUniversity of Michigan – DearbornDearbornUSA
  2. 2.Computer Science and EngineeringFlorida Atlantic UniversityBoca RatonUSA

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