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Physical Mechanisms of Stress-Field Formation near the Coating–Substrate Interface during Electron-beam Processing

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Russian Physics Journal Aims and scope

A model for calculating the residual stress in the vicinity the coating–substrate interface is presented. The model includes the temperature and phase composition variations. It is shown that the coating stresses significantly exceed the yield stress limit of the coating material. The stresses in the experimental modification conditions are caused by the changes in the composition as a result of heat-induced diffusion and chemical reactions.

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Authors and Affiliations

  1. Institute of Strength Physics and Materials Science of the Siberian Branch of the Russian Academy of Sciences, Tomsk, Russia

    O. N. Kryukova, A. G. Knyazeva & A. L. Maslov

Authors
  1. O. N. Kryukova
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  2. A. G. Knyazeva
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  3. A. L. Maslov
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Correspondence to O. N. Kryukova.

Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 6, pp. 63–69, June, 2020.

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Kryukova, O.N., Knyazeva, A.G. & Maslov, A.L. Physical Mechanisms of Stress-Field Formation near the Coating–Substrate Interface during Electron-beam Processing. Russ Phys J 63, 968–975 (2020). https://doi.org/10.1007/s11182-020-02125-0

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  • DOI: https://doi.org/10.1007/s11182-020-02125-0

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