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Current Instability in Four-Layer p–n–p–n-Structures

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The behavior of p 1n 1p 2n 2-structure with contacts to n 1- and n 2-regions was studied. It is shown that at such double electrode closing, four-layer structures do not have stationary state in a certain voltage range, i.e. they develop instability accompanied by the generation of relaxation current pulses. A physical model is proposed for the observed instability.

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References

  1. S. S. Bulgakov, O. D. Knab, A. P. Lysenko, Yu. A. Moma, Reviews in Electronic Engineering. Ser. 2. Semiconductors, Iss. 6 (1563), 71 (1990).

  2. A. P. Lysenko, Russ. Microelectron., 28, No. 2, 124 (1999).

    Google Scholar 

  3. A. P. Lysenko, Russ. Microelectron., 31, No. 5, 335 (2002).

    Article  MathSciNet  Google Scholar 

  4. A. P. Lysenko, Russ. Microelectron., 32, No. 2, 82 (2003).

    Article  MathSciNet  Google Scholar 

  5. A. P. Lysenko, Izv. Vyssh. Uchebn. Zaved. Electron., No. 4, 16–20 (1999).

  6. D. V. Bykov, F. I. Grigoriev, A. P. Lysenko, and N. I. Strogankova, Russ. Microelectron, 44, No. 7, 463–467 (2015).

    Article  Google Scholar 

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Correspondence to A. P. Lysenko.

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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 8, pp. 79–83, August, 2016.

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Lysenko, A.P. Current Instability in Four-Layer p–n–p–n-Structures. Russ Phys J 59, 1213–1218 (2016). https://doi.org/10.1007/s11182-016-0893-6

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  • DOI: https://doi.org/10.1007/s11182-016-0893-6

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