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Electric field strength at and near the cathode edge in a magnetically insulated coaxial diode

  • Physics of Magnetic Phenomena
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Russian Physics Journal Aims and scope

Abstract

For an annular cathode in a coaxial diode it has been shown that the averaged electric field strength at the end face of the cathode, En, depends on the edge thickness h as

$$ E_n \propto {1 \mathord{\left/ {\vphantom {1 {\sqrt h }}} \right. \kern-\nulldelimiterspace} {\sqrt h }} $$

. It has been found that the field strength varies with distance from the edge approximately as

$$ \propto {1 \mathord{\left/ {\vphantom {1 {\sqrt r }}} \right. \kern-\nulldelimiterspace} {\sqrt r }} $$

. The problem of the electric field strength at the edge of the cathode in a magnetically insulated coaxial diode has been solved for the case where the cathode emissivity is limited with the use of a model assuming a given internal resistance of the voltage source.

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References

  1. A. I. Fedosov, E. A. Litvinov, S. Ya. Belomyttsev, and S. P. Bugaev, Izv. Vyssh. Uchebn. Zaved., Fiz., No. 10, 134–135 (1977).

  2. L. D. Landau and E. M. Livshits, Field Theory [in Russian], Fizmatlit, Moscow (2006).

    Google Scholar 

  3. M. M. Bredov, V. V. Rumyantsev, and I. N. Toptygin, Classical Electrodynamics [in Russian], Lan, St. Petersburg (2003).

    Google Scholar 

  4. L. D. Landau and E. M. Livshits, Electrodynamics of Continuous Media [in Russian], Fizmatlit, Moscow (2005).

    Google Scholar 

  5. A. V. Gromov and N. F. Kovalev, Zh. Tekh. Fiz., No. 8, 19–24 (2006).

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Authors and Affiliations

  1. Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences, Tomsk, Russia

    S. Ya. Belomyttsev, I. V. Romanchenko & V. V. Rostov

Authors
  1. S. Ya. Belomyttsev
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  2. I. V. Romanchenko
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  3. V. V. Rostov
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Corresponding author

Correspondence to I. V. Romanchenko.

Additional information

__________

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 3, pp. 71–76, March, 2008.

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Belomyttsev, S.Y., Romanchenko, I.V. & Rostov, V.V. Electric field strength at and near the cathode edge in a magnetically insulated coaxial diode. Russ Phys J 51, 299–306 (2008). https://doi.org/10.1007/s11182-008-9052-z

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  • DOI: https://doi.org/10.1007/s11182-008-9052-z

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