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Formation of speckle interferograms characterizing transverse and longitudinal displacements of a light-scattering surface

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Abstract

The speckle-interferometer sensitivity to transverse or longitudinal displacements of a flat diffusively scattering surface is analyzed for the case of double-exposure recording of a speckle photography. It is shown that the interference pattern characterizing the transverse displacement of a scatterer is localized in the far-field diffraction region, and the interferometer sensitivity depends both on the value and sign of curvature of the spherical wavefront of coherent radiation used in the speckle-photography recording stage. The interference pattern charactering the longitudinal displacement of the scatterer is localized in the near-field diffraction region and in order to record it, spatial filtering of the diffraction field should be performed. The experimental data obtained agree with theory.

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Authors and Affiliations

  1. Tomsk State University, Russia

    V. G. Gusev

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  1. V. G. Gusev
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Correspondence to V. G. Gusev.

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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 47–54, April, 2007.

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Gusev, V.G. Formation of speckle interferograms characterizing transverse and longitudinal displacements of a light-scattering surface. Russ Phys J 50, 356–364 (2007). https://doi.org/10.1007/s11182-007-0049-9

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  • DOI: https://doi.org/10.1007/s11182-007-0049-9

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