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Application of Numerical Methods of Determining the Crystal Structure Parameters Based on a Single Diffraction Line Profile

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Methods of numerical modeling are used to detect coherently diffracting domains and microdistortions based on a single diffraction line profile. Results of processing of diffraction patterns recorded for Fe-0.3C-Cr-Mn-Si-Ni quenched steel tempered at different temperatures are presented.

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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 4, pp. 75–79, April, 2005.

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Korchevskii, V.V. Application of Numerical Methods of Determining the Crystal Structure Parameters Based on a Single Diffraction Line Profile. Russ Phys J 48, 412–416 (2005). https://doi.org/10.1007/s11182-005-0141-y

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  • DOI: https://doi.org/10.1007/s11182-005-0141-y

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