Skip to main content
Log in

Consideration of the effect of depth of primary electron penetration into a microchannel plate on a current gain

  • Published:
Russian Physics Journal Aims and scope

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

REFERENCES

  1. A. G. Berkovskii, V. A. Gavanin, and I. N. Zaidel’, Vacuum Photoelectron Devices [in Russian], Radio i Svyaz’, Moscow (1988).

    Google Scholar 

  2. A. E. Mudrov, Numerical Methods for PC in BASIC, FORTRAN, and PASCAL Languages [in Russian], RASKO, Tomsk (1991).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Additional information

__________

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 12, pp. 87–88, December, 2004.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Degtyarev, P.A. Consideration of the effect of depth of primary electron penetration into a microchannel plate on a current gain. Russ Phys J 47, 1317–1319 (2004). https://doi.org/10.1007/s11182-005-0075-4

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11182-005-0075-4

Keywords

Navigation