Abstract
Poly(p-xylylene)—CdS (PPX—CdS) nanocomposite films with different thicknesses (∼0.2, ∼0.5, ∼1, and ∼1.5 μm) and concentrations of CdS from 5 to 90 vol.%, as well as single-component CdS and PPX films with various thicknesses were studied by X-ray diffraction. The films were synthesized on polished silicon or quartz substrates by low-temperature vapor deposition method. It was shown that CdS nanoparticles in PPX—CdS films, depending on their thickness and CdS content, can have an X-ray amorphous structure, a defect crystal structure (RCP structure), or a wurtzite-type crystal structure. Similar structures were observed for single-component CdS films of the corresponding thickness. The sizes of the coherent scattering regions of CdS were determined for some nanocomposite and single-component films. Poly(p-xylylene) in the studied nanocomposite films was characterized by an X-ray amorphous structure.
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Published in Russian in Izvestiya AkademiiNauk. Seriya Khimicheskaya, No. 9, pp. 1699–1705, September, 2021.
This work was financially supported within the framework of the state assignment of the Institute of Biochemical Physics of the Russian Academy of Sciences (Project No. 01201253304) and by the Russian Foundation for Basic Research (Project No. 18-03-00582).
This paper does not contain descriptions of studies on animals or humans.
The authors declare no competing interests.
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Ivanova, O.P., Krivandin, A.V., Zav’yalov, S.A. et al. Structural variety of CdS in films synthesized by vapor deposition polymerization. Russ Chem Bull 70, 1699–1705 (2021). https://doi.org/10.1007/s11172-021-3272-6
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DOI: https://doi.org/10.1007/s11172-021-3272-6