In their recent article, Alipour et al. (Res Chem Intermed, 1. doi:10.1007/s11164-016-2594-8) studied the effect of pressure on the morphological characteristics and quality of synthesized graphene from SEM data. Here, the basics of fractal calculations and depth histogram will be explained to avoid such egregious mistakes between using AFM, SEM and stereo SEM images by authors.
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R. Alipour, M.R. Riazifar, T. Afsari, The effect of pressure on morphological features and quality of synthesized grapheme. Res. Chem. Intermed. (2016). doi:10.1007/s11164-016-2594-8
Ş. Ţălu, S. Solaymani, M. Bramowicz, S. Kulesza, A. Ghaderi, S. Shahpouri, S.M. Elahi, Effect of electric field direction and substrate roughness on threedimensional self-assembly growth of copper oxide nanowires. J. Mater. Sci. Mater. Electron. 27, 9272–9277 (2016)
Ş. Ţălu, M. Bramowicz, S. Kulesza, A. Ghaderi, S. Solaymani, M. Fathi Kenari, M. Ghoranneviss, Fractal features and surface micromorphology of diamond nano-crystals. J. Microsc. (2016). doi:10.1111/jmi.12422
Ş. Ţălu, S. Solaymani, M. Bramowicz, N. Naseri, S. Kulesza, A. Ghaderi, Surface micromorphology and fractal geometry of Co/CP/X (X = Cu, Ti, SM and Ni) nanoflake electrocatalysts. RSC Adv. 6, 27228–27234 (2016)
Ş. Ţălu, Micro and Nanoscale Characterization of Three Dimensional Surfaces. Basics and Applications (Napoca Star, Cluj-Napoca, 2015)
L. Reimer, Scanning Electron Microscopy (Springer, Berlin, 1985)
I. Ferguson, Scanning electron microscopy: applications and techniques, in UKAEA Diffraction Analysis Conference, Windscale, Warrington (1976)
O. Wells, Scanning Electron Microscopy (McGraw-Hill, New York, 1974)
A. Kayaalp, A. Rao, R. Jain, Scanning electron microscope-based stereo analysis. Mach. Vis. Appl. 3, 231–246 (1990)
D.N. Bhat, S.K. Nayar, Stereo and specular reflection. Mach. Vis. Appl. 26(2), 91–106 (1998)
ISO 25178-2, Geometrical Product Specifications (GPS)—Surface Texture: Areal—Part 2: Terms, Definitions and Surface Texture Parameters (2012). http://www.iso.org
S. Kulesza, M. Bramowicz, A comparative study of correlation methods for determination of fractal parameters in surface characterization. Appl. Surf. Sci. 293, 196–201 (2014)
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The authors report no conflict of interests. The authors alone are responsible for the content and writing of the paper.
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Solaymani, S., Ghaderi, A., Kulesza, S. et al. Comment on: ‘‘The effect of pressure on morphological features and quality of synthesized graphene’’ [Res Chem Intermed journal DOI 10.1007/s11164-016-2594-8]. Res Chem Intermed 43, 2237–2240 (2017). https://doi.org/10.1007/s11164-016-2758-6
- Morphological features
- Depth histogram
- Abbott–Firestone curve
- Root mean square
- Atomic force microscopy
- Scanning electron microscopy