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Interfacial Solute Segregation in the Thermally Grown Oxide of Thermal Barrier Coating Structures

Oxidation of Metals volume 82, pages 457–467 (2014)Cite this article

Abstract

Atom probe tomography is used to measure interfacial and grain boundary segregation in the thermally grown oxide layers found on thermal barrier coatings formed by isothermal heat treatments at 1,100 °C. Segregation of Zr, Hf, Y, and minor elements at the metal/oxide interfaces, oxide grain boundaries and oxide dislocations are observed, quantified and rationalised. The implications of the findings are discussed.

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Acknowledgments

This work was partly supported by The University of Michigan College of Engineering.

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Authors and Affiliations

  1. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109-2136, USA

    Yimeng Chen & Emmanuelle A. Marquis

  2. Department of Materials, University of Oxford, Oxford, OX1 3PH, UK

    Roger C. Reed

Authors
  1. Yimeng Chen
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  2. Roger C. Reed
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  3. Emmanuelle A. Marquis
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Correspondence to Emmanuelle A. Marquis.

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Chen, Y., Reed, R.C. & Marquis, E.A. Interfacial Solute Segregation in the Thermally Grown Oxide of Thermal Barrier Coating Structures. Oxid Met 82, 457–467 (2014). https://doi.org/10.1007/s11085-014-9502-7

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  • DOI: https://doi.org/10.1007/s11085-014-9502-7

Keywords

  • Thermal barrier coating
  • Segregation
  • Atom probe tomography
  • Grain boundary
  • Dislocations