Abstract
The transient oxidation stage of a model metal alloy thin film was characterized with in situ ultra-high vacuum (UHV) transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and analytical high-resolution TEM. We observed the formations of nanosized NiO and Cu2O islands when Cu-5at.%Ni(001) was exposed to oxygen partial pressure, \( {\text{pO}}_{ 2} = 1 \times 10^{ - 4} \,{\text{Torr}} \) and various temperatures in situ. At 350 °C epitaxial Cu2O islands formed initially and then NiO islands appeared on the surface of the Cu2O island, whereas at 550 °C NiO appeared first. XPS and TEM revealed a sequential formation of NiO and then Cu2O islands at 550 °C. The temperature-dependent oxide selection may be due to an increase of the diffusivity of Ni in Cu with increasing temperature.
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Acknowledgments
The authors thank M. France, L. Li and Z. Zhang for their assistance. This research program is supported by the National Science Foundation, Division of Materials Research (0706171). The ex situ TEM experiments were performed at Nanoscale Fabrication and Characterization Facility, University of Pittsburgh. The XPS experiments were carried out at the Center for Functional Nanomaterials at Brookhaven National Laboratory, which is supported by the Department of Energy, Office of Basic Energy Sciences (DE-AC02-98CH10886).
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Kang, Y., Luo, L., Tong, X. et al. Transient Oxidation of Cu-5at.%Ni(001): Temperature Dependent Sequential Oxide Formation. Oxid Met 79, 303–311 (2013). https://doi.org/10.1007/s11085-012-9332-4
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DOI: https://doi.org/10.1007/s11085-012-9332-4