Abstract
The beneficial effect of aluminum-ion implantation on the oxidation behavior of M5 alloy at 500°C has been studied. M5 alloy specimens were implanted with aluminum ions with fluences ranging from 1 × 1016 to 1 × 1018 ions/cm2, using a MEVVA source at a voltage of 40 kV at maximum temperature of 380°C. The weight-gain curves were measured after oxidation in air at 500°C for 120 min, which showed that a significant improvement was achieved in the oxidation behavior of M5 alloy implanted with aluminum compared with that of the as-received M5 alloy. The valences of elements in the implanted surface of M5 alloy were analyzed by X-ray photoemission spectroscopy (XPS), and the depth distributions of the elements in the surface of the samples were obtained by Auger-electron spectroscopy (AES). Scanning-electron microscopy (SEM) was used to examine the micro-morphology of oxidized samples. The color of the oxidized samples was checked by a scanner. Glancing-angle X-ray diffraction (GAXRD) at 0.3° incident angles was employed to examine the phase transformations of implanted samples before and after oxidization in air at 500°C for 120 min. It was found that when the fluence is 1 × 1018 ions/cm2the implanted M5 alloy is slightly oxidized. The mechanism of the improvement during oxidation is discussed.
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Lee S. J., Kwon H. S., Kim W., Choi B.H. (1991). Materials Science and Engineering A 263:23
Xu J., Bai X., Fan Y. (2000). Journal of Materials Science 35:6225
Etoh Y., Shimada S., Kikuchi K. (1992). Journal of Nuclear Science and Technology 29(12):1173
Xu J., Bai X., Jin A., Fan Y. (2000). Journal of Materials Science Letters 19:1633
Stroosnijder M. F., Sunderkotter J. D., Cristobal M. J., Jenett H., Isenbugel K., Baker M. A. (1996). Surface and Coatings Technology 83:205
Stroosnijder M. F., Mevrel R., Bennet M. J. (1994). Materials at High Temperatures 12:53
Saito Y., Onay B., Maruyanma T. (1993). Journal of De Physique 4(3):217
Stringer J. (1989). Materials Science and Engineering A 120:129
Przybylski K., Yurek G. J. (1989). Materials Science Forum 43:1
Pogrebnjak A.D., Bakharev O.G., Pogrebnjak N.A. Jr. (2000) Physics Letters A 265:225
Wang H. W., Yang D. Z., Shi W. D., Patu S. (1995). Scripta Metallurgica Materialia 32:2001
Mitsuo A., Uchida S., Nihira N., Iwaki M. (1998). Surface and Coatings Technology 103–104:98
Yang D., Zhou J., Xue Q. (1998). Surface and Coatings Technology 102:223
C. D. Wagner, W. M. Riggs, L. E. Davis, J.F. Moulder and G. E. Muilenberg eds. A Reference Book of Standard Data for Use in X-ray Photoelectron Spectroscopy (Perkin-Elmer corporation, Physical Electronics Division, 6509 Flying Cloud Drive, Eden Prairie, Minnesota 55344, 1992. p 100.
Acknowledgments
This work was supported by the National Nature Science Foundation of China (Grants No.50501011) and China Postdoctoral Science Foundation (37th batch, No. 2005037079). The authors would like to thank the Analysis Center of Tsinghua University for partial financial support.
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Peng, D.Q., Bai, X.D., Pan, F. et al. Influence of Implanted Aluminum Ions on the Oxidation Behavior of M5 Alloy at 500°C. Oxid Met 65, 377–390 (2006). https://doi.org/10.1007/s11085-006-9025-y
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DOI: https://doi.org/10.1007/s11085-006-9025-y