Abstract
Poor intensity and contrasts of the pictures produced by picture-acquiring equipment in low-light conditions create a significant barrier to completing other machine-learning activities. This is crucial to advance the study of low-light picture-enhancing techniques to allow the efficient performance of other visual tasks. This research introduces innovative recognition-based neural networks for generating high-quality augmented low-light pictures using raw sensory information to tackle such a challenging task. We initially use an artificial learning approach called CNN (Convolutional Neural networking) to decrease unwanted chromatic distortion and sound. Utilizing the non-local correlations present in the picture, the geographic attention component concentrates on de-noising. A system is directed to improve redundant color characteristics via the channels attention component. In addition, we suggest an innovative pooling level dubbed the reversed shuffle level that picks meaningful data from earlier characteristics in an adaptable manner. Numerous tests show the suggested system’s efficiency in reducing chromatic distortion and disturbance artifacts during improvement, particularly if the original low-light picture contains a lot of disturbance.
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UG: Conceptualization, methodology, data curation, investigation, writing—original draft, visualization. CHSD: Supervision, methodology, validation, reviewing, and editing. Abhay Chaturvedi: Methodology, software, formal analysis, visualization. Dr. Shankar B B: Resources, methodology, reviewing, and editing. Janjhyam Venkata Naga Ramesh: Methodology, software, formal analysis, visualization. Dr. Ajmeera Kiran: Conceptualization, supervision, reviewing, and editing. Each author contributed significantly to the research and preparation of the manuscript. All authors have read and approved the final version of the manuscript.
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Uganya, G., Devi, C.H.S., Chaturvedi, A. et al. Sub-network modeling and integration for low-light enhancement of aerial images. Opt Quant Electron 55, 984 (2023). https://doi.org/10.1007/s11082-023-05224-7
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DOI: https://doi.org/10.1007/s11082-023-05224-7