Abstract
We have theoretically modeled the impact of effective carrier capture cross-sections on the intermediate band generation recombination process of InAs/GaAs quantum dot solar cell (QDSC). The device characteristics are obtained from Poisson’s and continuity equations. The quantum dot (QD) occupation probability was utilized to estimate the effective capture cross-sections under different conditions. We observed that when the QDs become trap centers, the effective electron capture cross-section controls the QD recombination. Moreover, the QD recombination dominates the overall recombination process near the maximum power point (MPP) of the device. Hence, the electron capture cross-section plays a vital role in determining the performance of the QDSC. The results for n-type \(\delta \)-doped QDSCs also reported similar behavior. However, the analysis carried out for different Shockley-Read-Hall (SRH) recombination lifetimes indicated that with a decrease in SRH recombination lifetime representing the degraded barrier materials, SRH recombination becomes dominant. Hence the electron effective capture cross-section has a substantial impact on the device performance of the QDSCs for which the SRH recombination does not dominate over the intermediate band recombination at the MPP of the device.
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This article is part of the Topical Collection on Numerical Simulation of Optoelectronic Devices.
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Sharan, A., Kumar, J. Impact of effective capture cross-section on device performance of InAs/GaAs quantum dot solar cell. Opt Quant Electron 54, 543 (2022). https://doi.org/10.1007/s11082-022-03855-w
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DOI: https://doi.org/10.1007/s11082-022-03855-w