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Study of the phase noise spectrum in RF injection-locked single-loop optoelectronic oscillators

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Abstract

A method for the phase noise characterization of radio frequency (RF) injection-locked single-loop optoelectronic oscillators (OEO) is presented. Based on the injection-pulling dynamics of OEO under RF injection, this method is used to compute the phase noise spectrum of a free-running single-loop OEO. An expression for the far-out phase noise spectrum of a free-running single-loop OEO is presented to capture the far-out phase noise characteristics of the OEO. Also, we derive the expression for the close-in phase noise spectrum of the free-running single-loop OEO by considering the multiplicative noise as the overall loop-gain perturbation in the OEO loop. Considering strong RF signal injection and loop-gain perturbation, the power spectral density of the overall phase noise for an injection-locked single-loop OEO is computed in terms of the noise filtering band-width, which can be controlled by changing the lock-range of the RF injection locked OEO. The close-in phase noise is optimized by properly choosing the RF injection signal power. The experimental results are also given in partial support to the conclusions of the analysis.

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Authors and Affiliations

  1. Electronics and Communication Engineering Department, Academy of Technology, Adisaptagram, Hooghly, West Bengal, 712121, India

    Abhijit Banerjee

  2. Microwave and Optoelectronic Department, Aeronautical Institute of Technology (ITA), Marechal Eduardo Gomes, 50 - Vila das Acácias, São José dos Campos, SP, 12228-900, Brazil

    Larissa Aguiar Dantas de Britto & Gefeson Mendes Pacheco

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  1. Abhijit Banerjee
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  2. Larissa Aguiar Dantas de Britto
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  3. Gefeson Mendes Pacheco
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Correspondence to Abhijit Banerjee.

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Banerjee, A., de Britto, L.A.D. & Pacheco, G.M. Study of the phase noise spectrum in RF injection-locked single-loop optoelectronic oscillators. Opt Quant Electron 54, 60 (2022). https://doi.org/10.1007/s11082-021-03423-8

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  • DOI: https://doi.org/10.1007/s11082-021-03423-8

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