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Tilt illumination for structured illumination imaging

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Abstract

To achieve super-resolution imaging, the information in higher frequency of the observed sample is collected by illuminating with a structure beam for a limited optical transfer function. In this paper, tilt illumination mode is introduced to structured illumination microscopy (SIM) for enhancing lateral resolution. More sample spectrum more than traditional SIM, can be obtained by detector. Thus, SIM with tilt illumination can be improved at the aspect of lateral imaging resolution.

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Acknowledgements

This work was supported by the National Natural Science Foundation of China (Nos. 11874132, 61975044, and 12074094). The authors are indebted to reviewers for helpful comments and suggestions.

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Authors and Affiliations

  1. Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, 150080, China

    Xin Jin, Xuemei Ding, Jiubin Tan, Xuyang Zhou & Zhengjun Liu

  2. Key Lab of Ultra-precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin, 150080, China

    Xin Jin, Xuemei Ding, Jiubin Tan, Xuyang Zhou & Zhengjun Liu

  3. Department of Electrical Engineering, California Institute of Technology, Pasadena, 91125, CA, USA

    Cheng Shen

  4. Department of Physics, Harbin Institute of Technology, Harbin, 150001, China

    Shutian Liu

Authors
  1. Xin Jin
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  2. Xuemei Ding
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  3. Jiubin Tan
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  4. Cheng Shen
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  5. Xuyang Zhou
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  6. Shutian Liu
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  7. Zhengjun Liu
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Correspondence to Zhengjun Liu.

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Jin, X., Ding, X., Tan, J. et al. Tilt illumination for structured illumination imaging. Opt Quant Electron 53, 516 (2021). https://doi.org/10.1007/s11082-021-03174-6

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