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A method for the characterization of intra-pixel response of infrared sensor

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Abstract

Due to the response variations within a pixel, response of sensor varies with the positions of the point target. The accurate measurement of intra-pixel response of the sensor is the key to high-precision centroid estimation and radiometric calibration. In this paper, we establish an intra-pixel response model based on the pixel structure and use Gauss function to describe the beam spot profile. We further calculate the full width at half maximum (FWHM) of the Gauss function and the fill factor of the infrared sensor using the grid search algorithm. Experimental results show that the Gauss function FWHM differences among different pixels using the same radius could be less than 6%. The fill factors are not constant in different pixels because of errors in the process of manufacture and assembly, and the error between model and measured values is less than 3.6%. This work could be useful for stellar calibration and centroid estimation.

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Authors and Affiliations

  1. Key Laboratory of Intelligent Infrared Perception, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China

    Zhuoyue Hu, Xiaofeng Su, Xiaoyan Li, Lili Zhang & Fansheng Chen

  2. State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yu Tian Road, Shanghai, 200083, China

    Lili Zhang & Fansheng Chen

  3. University of Chinese Academy of Sciences, Beijing, 100049, China

    Zhuoyue Hu & Xiaoyan Li

Authors
  1. Zhuoyue Hu
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  2. Xiaofeng Su
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  3. Xiaoyan Li
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  4. Lili Zhang
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  5. Fansheng Chen
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Correspondence to Lili Zhang or Fansheng Chen.

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Hu, Z., Su, X., Li, X. et al. A method for the characterization of intra-pixel response of infrared sensor. Opt Quant Electron 51, 74 (2019). https://doi.org/10.1007/s11082-019-1790-3

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