Abstract
In this research, we investigated carbon–nickel composite films prepared by RF-magnetron co-sputtering on quartz substrates using a multi-component target (10 cm in diameter) consisting of pure graphite (99.99%) and strips of pure nickel (approx. 2 cm2 in size) attached to the graphite race track, that corresponds to around 2.5% in area. The substrates were ultrasonically cleaned in acetone bath for 20 min and dried in hot air flow prior to deposition process. The films were grown at room temperature in a deposition chamber evacuated to a base pressure 1 × 10−3 N/m2 and then the constant Argon working pressure of 4 N/m2 was settled and maintained by throttle valve. Deposition was done in constant RF power regime 400 W. The films were deposited for 600 s and then annealed for 2 h in a furnace at the temperature: 300, 500, 800 and 1000 °C under ambient atmospheric pressure.
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Arman, A., Ghodselahi, T., Molamohammadi, M., Solaymani, S., Zahrabi, H., Ahmadpourian, A.: Microstructure and optical properties of Cu@Ni nanoparticles embedded in a-C:H. Prot. Met. Phys. Chem. Surf. 51(4), 575–578 (2015)
Bramowicz, M., Kulesza, S., Rychlik, K.: Comparison between contact and tapping AFM modes in surface morphology studies. Tech. Sci. 15(2), 307–318 (2012)
Bramowicz, M., Kulesza, S., Lipiński, T., Szabracki, P., Piątkowski, P.: Fractal analysis of AFM data characterizing strongly isotropic and anisotropic surface topography. Solid State Phenom. 203–204, 86–89 (2013)
Dallaeva, D., Ţălu, Ş., Stach, S., Škarvada, P., Tománek, P., Grmela, L.: AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Appl. Surf. Sci. 312, 81–86 (2014)
Dalouji, V., Elahi, S.M.: Effect of annealing temperature on the optical loss and the optical constants of RF-magnetron sputtered carbon–nickel composite films. J. Korean Phys. Soc. 64(6), 857 (2014)
Dalouji, V., Elahi, S.M., Solaymani, S., Ghaderi, A., Elahi, H.: Carbon films embedded by nickel nanoparticles: fluctuation in hopping rate and variable-range hopping with respect to annealing temperature. Appl. Phys. A 122, 541 (2016a)
Dalouji, V., Elahi, S.M., Naderi, S.: Surface plasmon resonance and electrical properties of RF: magnetron sputtered carbon–nickel composite films at different annealing temperatures. Rare Met. 35(11), 863–869 (2016b)
Dong, W.P., Sullivan, P.J., Stout, K.J.: Comprehensive study of parameters for characterizing 3-dimensional surface topography. 4. Parameters for characterizing spatial and hybrid properties. Wear 178, 45–60 (1994)
Elahi, S.M., Dalouji, V., Mehrparvar, D., Valedbagi, S.: Influence of deposition rate on optical properties of RF-magnetron sputtered carbon–nickel composite films deposited at different deposition times. Mol. Cryst. Liq. Cryst. 587(1), 105 (2013)
Endrino, J.L., Escobar Galindo, R., Zhang, H.S., Allen, M., Gago, R., Espinosa, A., Anders, A.: Structure and properties of silver-containing a-C(H) films deposited by plasma immersion ion implantation. Surf. Coat. Technol. 202, 3675–3682 (2008)
Ghodselahi, T., Vesaghi, M.A., Gelali, A., Zahrabi, H., Solaymani, S.: Morphology, optical and electrical properties of Cu–Ni nanoparticles in aC: H prepared by co-deposition of RF-sputtering and RF-PECVD. Appl. Surf. Sci. 258(2), 727–731 (2011)
Ghodselahi, T., Solaymani, S., Akbarzadeh Pasha, M., Vesaghi, M.A.: Ni nanoparticle catalyzed growth of MWCNTs on Cu NPs @ a-C: H substrate. Eur. Phys. J. D 66, 299 (2012)
Goh, C.F., Yu, H., Yong, S.S., Mhaisalkar, S.G., Boey, F.Y.C., Teo, P.S.: The effect of annealing on the morphologies and conductivities of sub-micrometer sized nickel particles used for electrically conductive adhesive. Thin Solid Films 504, 416–420 (2006)
Kambhampati, D.K., Knoll, W.: Surface-plasmon optical techniques. Curr. Opin. Colloid Interface Sci. 4(4), 273 (1994)
Kim, S., Hyun, K., Moon, J.Y., Clasen, C., Ahn, K.H.: Depletion stabilization in nanoparticle–polymer suspensions: multi-length-scale analysis of microstructure. Langmuir 31(6), 1892–1900 (2015)
Korotcenkov, G., Han, S.D., Stetter, J.R.: Review of electrochemical hydrogen sensors. Chem. Rev. 109(3), 1402 (2009)
Kulesza, S., Bramowicz, M.: A comparative study of correlation methods for determination of fractal parameters in surface characterization. Appl. Surf. Sci. 293, 196–201 (2014)
Naseri, N., Solaymani, S., Ghaderi, A., Bramowicz, M., Kulesza, S., Ţălu, Ş., Pourreza, M., Ghasemi, S.: Microstructure, morphology and electrochemical properties of Co nanoflake water oxidation electrocatalyst at micro-and nanoscale. RSC Adv. 7(21), 12923–12930 (2017)
Sayles, R.S., Thomas, T.R.: Spatial representation of surface roughness by means of structure function–practical alternative to correlation. Wear 42, 263–276 (1997)
Solaymani, S., Ghaderi, A., Nezafat, B.: Comment on: “characterization of microroughness parameters in titanium nitride thin films grown by DC magnetron sputtering” (J fusion energ DOI 10.1007/s10894-012-9510-z). J. Fusion Energy 31(6), 591 (2012)
Stach, S., Cybo, J.: Multifractal description of fracture morphology: theoretical basis. Mater. Charact. 51(1), 79–86 (2003)
Stach, S., Cybo, J., Chmiela, J.: Fracture surface–fractal or multifractal? Mater. Charact. 46(2–3), 163–167 (2001)
Stach, S., Dallaeva, D., Ţălu, Ş., Kaspar, P., Tománek, P., Giovanzana, S., Grmela, L.: Morphological features in aluminum nitride epilayers prepared by magnetron sputtering. Mater. Sci. Pol. 33(1), 175–184 (2015)
Ţălu, Ş., Stach, S., Mahajan, A., Pathak, D., Wagner, T., Kumar, A., Bedi, R.K.: Multifractal analysis of drop-casted copper(II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates. Surf. Interface Anal. 46(6), 393–398 (2014)
Ţălu, Ş., Stach, S., Ghodselahi, T., Ghaderi, A., Solaymani, S., Boochani, A., Garczyk, Ż.: Topographic characterization of Cu–Ni NPs @ a-C: H films by AFM and multifractal analysis. J Phys. Chem. B. 119(17), 5662–5670 (2015a)
Ţălu, Ş., Stach, S., Solaymani, S., Moradian, R., Ghaderi, A., Hantehzadeh, M.R., Elahi, S.M., Garczyk, Ż., Izadyar, S.: Multifractal spectra of atomic force microscope images of Cu/Fe nanoparticles based films thickness. J. Electroanal. Chem. 749(31–41), 9 (2015b)
Ţălu, Ş., Bramowicz, M., Kulesza, S., Shafiekhani, A., Ghaderi, A., Mashayekhi, F., Solaymani, S.: Microstructure and tribological properties of FeNPs@a-C: H films by micromorphology analysis and fractal geometry. Ind. Eng. Chem. Res. 54(33), 8212–8218 (2015c)
Ţălu, Ş., Bramowicz, M., Kulesza, S., Dalouji, V., Solaymani, S., Valedbagi, S.: Fractal features of carbon–nickel composite thin films. Microsc. Res. Tech. 79(12), 1208–1213 (2016a)
Ţălu, Ş., Bramowicz, M., Kulesza, S., Ghaderi, A., Dalouji, V., Solaymani, S., Fathi Kenari, M., Ghoranneviss, M.: Fractal features and surface micromorphology of diamond nanocrystals. J. Microsc. 264(2), 143–152 (2016b)
Ţălu, Ş., Bramowicz, M., Kulesza, S., Solaymani, S., Shafikhani, A., Ghaderi, A., Ahmadirad, M.: Gold nanoparticles embedded in carbon film: micromorphology analysis. J. Ind. Eng. Chem. 35, 158–166 (2016c)
Ţălu, Ş., Solaymani, S., Bramowicz, M., Kulesza, S., Ghaderi, A., Shahpouri, S., Elahi, S.: Effect of electric field direction and substrate roughness on three-dimensional self-assembly growth of copper oxide nanowires. J. Mater. Sci. Mater. Electron. 27(9), 9272–9277 (2016d)
Ţălu, Ş., Luna, C., Ahmadpourian, A., Achour, A., Arman, A., Naderi, S., Ghobadi, N., Stach, S., Safibonab, B.: Micromorphology and fractal analysis of nickel–carbon composite thin films. J. Mater. Sci. Mater. Electron. 27(11), 11425–11431 (2016e)
Ţălu, Ş., Solaymani, S., Bramowicz, M., Naseri, N., Kulesza, S., Ghaderi, A.: Surface micromorphology and fractal geometry of Co/CP/X (X = Cu, Ti, SM and Ni) nanoflake electrocatalysts. RSC Adv. 6(32), 27228–27234 (2016f)
Ţălu, Ş., Bramowicz, M., Kulesza, S., Solaymani, S., Ghaderi, A., Dejam, L., Boochani, A., Elahi, S.M.: Microstructure and micromorphology of ZnO thin films: case study on Al doping and annealing effects. Superlattices Microstruct. 93, 109–121 (2016g)
Ţălu, Ş., Bramowicz, M., Kulesza, S., Shafiekhani, A., Rahmati, M., Ghaderi, A., Ahmadirad, M., Solaymani, S.: Microstructure of nickel nanoparticles embedded in carbon films: case study on annealing effect by micromorphology analysis. Surf. Interface Anal. 49(3), 153–160 (2017)
Thomas, A., Thomas, T.R.: Digital analysis of very small scale surface roughness. J. Wave Mater. Interact. 3, 341–350 (1988)
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Ţălu, Ş., Bramowicz, M., Kulesza, S. et al. Influence of annealing process on surface micromorphology of carbon–nickel composite thin films. Opt Quant Electron 49, 204 (2017). https://doi.org/10.1007/s11082-017-1040-5
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DOI: https://doi.org/10.1007/s11082-017-1040-5