Abstract
On-line phase measuring profilometry based on phase matching is proposed. While just one fixed sinusoidal fringe is projected on a measured object moving with the pipeline, deformed patterns modulated by the object moving at the same distance moment are captured synchronously by the CCD camera. The phase information of the object in those captured deformed patterns can be predicted using FTP method to assist the pixel matching so as to realize the point-to-point correspondence of the object in the captured deformed patterns. Meanwhile, the equivalent phase-shifting deformed patterns can be extracted. So the three dimensional shape of the object can be reconstructed successfully with an equal phase-shifting algorithm. Numerical simulation and experiments show feasibility and validity of the proposed method.
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Acknowledgments
This work is supported by 863 National Plan Foundation of China under Grant No. 2007AA01Z333 and Special Grand National Project of China under Grant No. 2009ZX02204-008.
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Xu, X., Cao, Y., Chen, C. et al. On-line phase measuring profilometry based on phase matching. Opt Quant Electron 48, 411 (2016). https://doi.org/10.1007/s11082-016-0675-y
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DOI: https://doi.org/10.1007/s11082-016-0675-y