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Performance analysis of 1300 nm SLEDs – impact of temperature and length scaling

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Abstract

The impact of self-heating and cavity length on the spectral emission properties of SLEDs is investigated using a state-of-the-art simulation tool. Simulated data are compared to measurements for two InP-based benchmark devices operating around 1300 nm, and excellent agreement is achieved in either case.

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Authors and Affiliations

  1. Integrated Systems Laboratory, ETH Zurich, Gloriastrasse 35, CH-8032, Zurich, Switzerland

    Martin Loeser & Bernd Witzigmann

  2. Exalos AG, Wagistr. 21, CH-8952, Schlieren, Switzerland

    Lorenzo Occhi, Christian Vélez & Raffaele Rezzonico

Authors
  1. Martin Loeser
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  2. Lorenzo Occhi
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  3. Christian Vélez
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  4. Raffaele Rezzonico
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  5. Bernd Witzigmann
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Corresponding author

Correspondence to Martin Loeser.

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Loeser, M., Occhi, L., Vélez, C. et al. Performance analysis of 1300 nm SLEDs – impact of temperature and length scaling. Opt Quant Electron 38, 1069–1075 (2006). https://doi.org/10.1007/s11082-006-9012-1

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  • DOI: https://doi.org/10.1007/s11082-006-9012-1

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